Changes in the Spectral Characteristics of Some Polymeric Materials in the Frequency Range from 0.2 to 2 THz as a Result of Exposure to a Megawatt Flux of Submillimeter Radiation of Microsecond Duration
A. V. Arzhannikov, S. L. Sinitsky, D. A. Samtsov, P. V. Kalinin, S. A. Kuznetsov, V. D. Stepanov, S. S. Popov, E. S. Sandalov, M. G. Atlukhanov, A. V. Stankevich, A. V. Pestov, N. A. Nikolaev, A. A. Rybak
{"title":"Changes in the Spectral Characteristics of Some Polymeric Materials in the Frequency Range from 0.2 to 2 THz as a Result of Exposure to a Megawatt Flux of Submillimeter Radiation of Microsecond Duration","authors":"A. V. Arzhannikov, S. L. Sinitsky, D. A. Samtsov, P. V. Kalinin, S. A. Kuznetsov, V. D. Stepanov, S. S. Popov, E. S. Sandalov, M. G. Atlukhanov, A. V. Stankevich, A. V. Pestov, N. A. Nikolaev, A. A. Rybak","doi":"10.1134/S1027451025700181","DOIUrl":null,"url":null,"abstract":"<p>The effect of exposure to pulsed megawatt submillimeter (0.1–0.4 THz) radiation fluxes on the spectral characteristics of some thin-film polymer materials in the frequency range from 0.2 to 2 THz has been registered. The polymer samples were characterized using technical solutions within the framework of time-domain spectroscopy and BWO spectroscopy. For the exposure, a radiation flux in the submillimeter wavelength range with a duration of about 4 μs, generated during beam–plasma interaction at the GOL–PET facility (Budker Institute of Nuclear Physics SB RAS), was used. Relative changes in the real part of the permittivity of individual polyvinylidene fluoride samples were found to reach a level of 0.5 with an initial value of about 3.0, while for polyvinyl chloride samples, no changes in this parameter were registered. At the same time, for individual polyurea samples, both significant and negligible changes in this parameter were observed as a result of the exposure. The results of the experiments provide a basis for using thin-film polymer materials as substrates for supramolecular complex samples, which during research will be exposed to powerful pulsed radiation fluxes in the submillimeter wavelength range.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 1","pages":"115 - 121"},"PeriodicalIF":0.4000,"publicationDate":"2025-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451025700181","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The effect of exposure to pulsed megawatt submillimeter (0.1–0.4 THz) radiation fluxes on the spectral characteristics of some thin-film polymer materials in the frequency range from 0.2 to 2 THz has been registered. The polymer samples were characterized using technical solutions within the framework of time-domain spectroscopy and BWO spectroscopy. For the exposure, a radiation flux in the submillimeter wavelength range with a duration of about 4 μs, generated during beam–plasma interaction at the GOL–PET facility (Budker Institute of Nuclear Physics SB RAS), was used. Relative changes in the real part of the permittivity of individual polyvinylidene fluoride samples were found to reach a level of 0.5 with an initial value of about 3.0, while for polyvinyl chloride samples, no changes in this parameter were registered. At the same time, for individual polyurea samples, both significant and negligible changes in this parameter were observed as a result of the exposure. The results of the experiments provide a basis for using thin-film polymer materials as substrates for supramolecular complex samples, which during research will be exposed to powerful pulsed radiation fluxes in the submillimeter wavelength range.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.