Transient response of Griffith crack in piezoelectric semiconductors under impact loading: Mode-I problem

Abstract

The transient response properties of an infinite piezoelectric semiconductor strip with a Griffith crack under dynamic impact loadings are investigated by using the Laplace and Fourier transforms and introducing dislocation density functions, where electrically impermeable crack-face conditions are adopted. This work emphasizes to analysis the transient variations of dynamic energy release rate of the present Mode-I fracture problem, which is derived firstly under various loading combinations and for different initial carrier concentrations and crack configurations. Some useful phenomena are observed. Among them, the dependence of crack propagation on the loading combinations is significant, and negative current (or voltage) loading much more effectively suppresses crack propagation.