Research on Resistivity Control Strategy for the Preparation of Crystalline Silicon Ingots Using Recycled Silicon Materials

IF 3.3 3区 材料科学 Q3 CHEMISTRY, PHYSICAL
Silicon Pub Date : 2025-07-28 DOI:10.1007/s12633-025-03409-1
Liang He, Hongzhi Luo, Fahui Wang, Guojun Zha, Yunhui Kuang, Qi Lei, Yunfei Xu, Xiaojuan Cheng, Wei Mao
{"title":"Research on Resistivity Control Strategy for the Preparation of Crystalline Silicon Ingots Using Recycled Silicon Materials","authors":"Liang He,&nbsp;Hongzhi Luo,&nbsp;Fahui Wang,&nbsp;Guojun Zha,&nbsp;Yunhui Kuang,&nbsp;Qi Lei,&nbsp;Yunfei Xu,&nbsp;Xiaojuan Cheng,&nbsp;Wei Mao","doi":"10.1007/s12633-025-03409-1","DOIUrl":null,"url":null,"abstract":"<div><p>In this work, we studied the resistivity calculation and control strategies for recycled silicon materials co-doped with multiple impurity elements. The resistivity distribution and performance of silicon ingots produced using two approaches: batching doping calculation based on measured resistivity values versus that incorporating the resistivity contributions of individual impurity elements were analyzed and compared. The results demonstrated that: when the measured resistivity values were used in batching doping calculation, there was a large deviation between the actual resistivity of the silicon ingot and the theoretically calculated resistivity. This led to a high risk of out-of-control resistivity in the ingredient formulation, which affects the product qualification rate and electrical performance. In contrast, by controlling the resistivity values of various impurity elements for batching doping calculation of recycled silicon materials, the resistivity of the silicon ingot was generally close to the theoretically calculated value. Both the product qualification rate and electrical performance were comparable to those of conventional silicon ingots. Therefore, this method can effectively reduce the material cost of polycrystalline silicon feedstocks. In addition, the recycling of silicon materials is beneficial to environmental protection.</p></div>","PeriodicalId":776,"journal":{"name":"Silicon","volume":"17 13","pages":"3213 - 3221"},"PeriodicalIF":3.3000,"publicationDate":"2025-07-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Silicon","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s12633-025-03409-1","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0

Abstract

In this work, we studied the resistivity calculation and control strategies for recycled silicon materials co-doped with multiple impurity elements. The resistivity distribution and performance of silicon ingots produced using two approaches: batching doping calculation based on measured resistivity values versus that incorporating the resistivity contributions of individual impurity elements were analyzed and compared. The results demonstrated that: when the measured resistivity values were used in batching doping calculation, there was a large deviation between the actual resistivity of the silicon ingot and the theoretically calculated resistivity. This led to a high risk of out-of-control resistivity in the ingredient formulation, which affects the product qualification rate and electrical performance. In contrast, by controlling the resistivity values of various impurity elements for batching doping calculation of recycled silicon materials, the resistivity of the silicon ingot was generally close to the theoretically calculated value. Both the product qualification rate and electrical performance were comparable to those of conventional silicon ingots. Therefore, this method can effectively reduce the material cost of polycrystalline silicon feedstocks. In addition, the recycling of silicon materials is beneficial to environmental protection.

利用再生硅材料制备结晶硅锭的电阻率控制策略研究
本文研究了多杂质共掺杂再生硅材料的电阻率计算及控制策略。分析比较了采用基于电阻率测量值的间歇掺杂计算和采用单个杂质元素的电阻率贡献计算两种方法生产的硅锭的电阻率分布和性能。结果表明:将测量到的电阻率值用于间歇掺杂计算时,硅锭的实际电阻率与理论计算的电阻率存在较大偏差。这导致了成分配方中电阻率失控的风险很高,影响了产品合格率和电气性能。相比之下,通过控制各种杂质元素的电阻率值进行回收硅材料的配料掺杂计算,硅锭的电阻率总体上接近理论计算值。产品合格率和电性能均可与常规硅锭媲美。因此,该方法可以有效降低多晶硅原料的材料成本。此外,硅材料的回收利用有利于环境保护。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Silicon
Silicon CHEMISTRY, PHYSICAL-MATERIALS SCIENCE, MULTIDISCIPLINARY
CiteScore
5.90
自引率
20.60%
发文量
685
审稿时长
>12 weeks
期刊介绍: The journal Silicon is intended to serve all those involved in studying the role of silicon as an enabling element in materials science. There are no restrictions on disciplinary boundaries provided the focus is on silicon-based materials or adds significantly to the understanding of such materials. Accordingly, such contributions are welcome in the areas of inorganic and organic chemistry, physics, biology, engineering, nanoscience, environmental science, electronics and optoelectronics, and modeling and theory. Relevant silicon-based materials include, but are not limited to, semiconductors, polymers, composites, ceramics, glasses, coatings, resins, composites, small molecules, and thin films.
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