Synthesis of Fullerenes C60 and C70

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
D. N. Borisenko
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引用次数: 0

Abstract

The synthesis of fullerenes C60 and C70 in an electric arc in the atmospheres of various gases, such as argon, helium, krypton, and hydrogen, at pressures in the range of 0.01–0.1 MPa was investigated. A stronger influence of gas-dynamic forces compared to the pinch effect on the possibility of obtaining a cathode deposit and a fullerene-containing soot with a falling volt-ampere characteristic was shown. The parameters of the electric arc, the structure of the cathode deposit, and the possibility of its production in various gases were determined. Spectral analysis of gas samples after experiments using hydrogen did not reveal the presence of hydrocarbons in the working atmosphere of the reactor. Selective deposition on a metal substrate under the action of a high-voltage electric field made it possible to separate a finely dispersed mixture of fullerenes C60 and C70 contained in the arc discharge plasma. It was found that the fractional composition of the C60/C70 fullerene mixture changes depending on the value of the substrate potential.

Abstract Image

富勒烯C60和C70的合成
研究了在0.01 ~ 0.1 MPa的氩气、氦气、氪气和氢气气氛下,电弧合成富勒烯C60和C70的过程。与夹紧效应相比,气体动力对阴极沉积和伏安特性下降的含富勒烯烟尘的可能性的影响更大。确定了电弧的参数、阴极镀层的结构以及在各种气体中产生阴极镀层的可能性。氢气实验后气体样品的光谱分析并没有揭示反应器工作气氛中碳氢化合物的存在。在高压电场的作用下,选择性沉积在金属衬底上,使得分离电弧放电等离子体中含有的精细分散的富勒烯C60和C70混合物成为可能。结果表明,C60/C70富勒烯混合物的分数组成随底物电位的变化而变化。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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