{"title":"Fredkin Gate-based Arbiter PUF design through challenge obfuscation using garbage outputs","authors":"Chinni Prabhunath G. , Ambika Prasad Shah","doi":"10.1016/j.vlsi.2025.102531","DOIUrl":null,"url":null,"abstract":"<div><div>This paper presents the design and implementation of a Fredkin Gate (FRG)-based Arbiter PUF using a novel challenge obfuscation method via garbage outputs, termed Garbage-induced Challenge Preprocessing FRG-based Arbiter PUF (GCP-APUF). The approach scrambles the input challenge using garbage outputs from FRG switch blocks, which are affected by fabrication process variations, introducing uncertainty in the PUF input. A mathematical model of the design is provided. The GCP-APUF is implemented on a 28 nm Artix-7 FPGA using a 64-bit XNOR-based LFSR for challenge generation, with manually placed switch blocks and an Arbiter, producing 48-bit response outputs. The design achieves 51.51% uniformity and 47.35% uniqueness. Compared to conventional and FRG Arbiter PUFs, it shows increased uniformity by 18.94% and 5.57%, and uniqueness by 5.61% and 4.10%, respectively. Reliability, BER, and KER are 92.85%, 7.2%, and 0.955. Randomness tests are passed. Machine learning susceptibility using neural networks yields a low CRP prediction accuracy of 50.43%, indicating strong resistance.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"106 ","pages":"Article 102531"},"PeriodicalIF":2.5000,"publicationDate":"2025-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025001889","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents the design and implementation of a Fredkin Gate (FRG)-based Arbiter PUF using a novel challenge obfuscation method via garbage outputs, termed Garbage-induced Challenge Preprocessing FRG-based Arbiter PUF (GCP-APUF). The approach scrambles the input challenge using garbage outputs from FRG switch blocks, which are affected by fabrication process variations, introducing uncertainty in the PUF input. A mathematical model of the design is provided. The GCP-APUF is implemented on a 28 nm Artix-7 FPGA using a 64-bit XNOR-based LFSR for challenge generation, with manually placed switch blocks and an Arbiter, producing 48-bit response outputs. The design achieves 51.51% uniformity and 47.35% uniqueness. Compared to conventional and FRG Arbiter PUFs, it shows increased uniformity by 18.94% and 5.57%, and uniqueness by 5.61% and 4.10%, respectively. Reliability, BER, and KER are 92.85%, 7.2%, and 0.955. Randomness tests are passed. Machine learning susceptibility using neural networks yields a low CRP prediction accuracy of 50.43%, indicating strong resistance.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.