Cross-channel image chain scrambling encryption algorithm using two memristor-based twin multi-scroll hyperchaotic systems

IF 2.5 3区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE

Integration-The Vlsi Journal Pub Date : 2025-09-19 DOI:10.1016/j.vlsi.2025.102564

Zhenju Wang, Cong Wang, Ping Ma, Hongli Zhang, Shaohua Zhang

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引用次数: 0

Abstract

This paper proposes a cross-channel image chain scrambling encryption algorithm based on two 5D memristive twin multi-scroll hyperchaotic systems. Firstly, two flux-controlled memristor models are introduced based on the simplification of Chua's system, and two 5D memristive twin multi-scroll hyperchaotic systems are designed by inputting different flux variables. The twin 5D memristive multi-scroll hyperchaotic systems exhibit the characteristics of variable scroll numbers and different topological structures. Secondly, a fractal-like cross-channel encryption algorithm is proposed, which combines cross-channel scrambling of sub-image and Zigzag transformation. Based on comprehensive experimental analysis, the results reveal that the key space is determined to be 2⁵²⁵, the information entropy of the ciphertext images across three channels approaches 7.9994, and the pixel correlation is reduced to nearly zero. Furthermore, NPCR and UACI exhibit values close to their theoretical benchmarks of 99.6094 % and 33.4635 %, respectively, highlighting the superior performance of the proposed encryption algorithm in terms of robustness and security.

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基于双忆阻器的双多涡旋超混沌系统的跨通道图像链置乱加密算法

提出了一种基于两个5D记忆双多涡旋超混沌系统的跨信道图像链置乱加密算法。首先，在对Chua系统进行简化的基础上，引入了两种磁控记忆电阻模型，并通过输入不同的磁通变量，设计了两个5D记忆双多涡旋超混沌系统。双5D记忆多涡旋超混沌系统具有变涡旋数和不同拓扑结构的特点。其次，提出了一种分形交叉信道加密算法，该算法将子图像的交叉信道置乱与之字形变换相结合。综合实验分析结果表明，确定密钥空间为2525，三通道密文图像的信息熵接近7.9994，像素相关性降至接近于零。此外，NPCR和UACI的值分别接近其理论基准99.6094%和33.4635%，突出了所提出的加密算法在鲁棒性和安全性方面的优越性能。

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来源期刊

Integration-The Vlsi Journal 工程技术-工程：电子与电气

CiteScore

3.80

自引率

5.30%

发文量

107

审稿时长

6 months

期刊介绍： Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.