{"title":"Automated Generation of Benchmarks for Falsification of STL Specifications","authors":"Yipei Yan;Deyun Lyu;Zhenya Zhang;Paolo Arcaini;Jianjun Zhao","doi":"10.1109/TCAD.2025.3550410","DOIUrl":null,"url":null,"abstract":"Falsification, whose aim is to detect unsafe behaviors of cyber-physical systems (CPS) that violate signal temporal logic (STL) specifications, has been actively investigated in the past decade. Although numerous falsification approaches have been proposed, the falsification community suffers from a shortage of benchmarks that hinders a thorough assessment of those falsification approaches. In this article, we bridge this gap by proposing an automated approach for generating falsification benchmarks. Our approach is data-driven: first, we generate different time-variant traces (acting as system output traces) that satisfy a given STL specification, and we associate these with corresponding system input traces; then, we use these input and output traces to train an LSTM model that generalizes them. These models can serve as benchmarks for assessing falsification approaches against the given specification. In the experimental evaluation, we validate the generated models by measuring their ability to differentiate the performance of different falsification approaches. Our generated models expose strengths and weaknesses of all the considered falsification approaches, which was not achieved by benchmarks currently used in the falsification community. These results demonstrate the usefulness of our approach and can potentially push forward subsequent research in falsification.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"44 10","pages":"4004-4017"},"PeriodicalIF":2.9000,"publicationDate":"2025-03-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10922764/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Falsification, whose aim is to detect unsafe behaviors of cyber-physical systems (CPS) that violate signal temporal logic (STL) specifications, has been actively investigated in the past decade. Although numerous falsification approaches have been proposed, the falsification community suffers from a shortage of benchmarks that hinders a thorough assessment of those falsification approaches. In this article, we bridge this gap by proposing an automated approach for generating falsification benchmarks. Our approach is data-driven: first, we generate different time-variant traces (acting as system output traces) that satisfy a given STL specification, and we associate these with corresponding system input traces; then, we use these input and output traces to train an LSTM model that generalizes them. These models can serve as benchmarks for assessing falsification approaches against the given specification. In the experimental evaluation, we validate the generated models by measuring their ability to differentiate the performance of different falsification approaches. Our generated models expose strengths and weaknesses of all the considered falsification approaches, which was not achieved by benchmarks currently used in the falsification community. These results demonstrate the usefulness of our approach and can potentially push forward subsequent research in falsification.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.