Zhengyi Hou , Luyao Shi , Yan Qiao , Bi Wang , Bi Wu , Lirida Naviner , Zhaohao wang
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引用次数: 0
Abstract
Approximate computing is widely used for decreasing the power and area consumption of a system since there are many error-tolerant multimedia applications nowadays. NAND-like spin–orbit torque magnetic tunnel junction (SOT-MTJ) as a novel non-volatile multi-bit memory device with high speed and high area efficiency, has a location-related stochastic switching mechanism, which can achieve 100% accuracy for high significant bits (HSBs) while storing low significant bits (LSBs) approximately through the decrease of writing pulse width. Thus, it is highly suitable for the approximate storage and updating of data. In this work, we proposed a quality-configurable last-level cache based on the NAND-like SOT MRAM by utilizing location-related stochastic switching, where the write pulse width is used as an accuracy knob to switch between precise storage and approximate storage. A highly efficient write operation and a specific pipeline read policy are designed to adapt the novel cell structure and application scenarios. To evaluate the performance of the proposal, a circuit-level simulation model NVSim and a set of approximate computing benchmarks Axbench are utilized. By reducing the writing pulse width of the NAND-like SOT MTJs from 3 ns to 1 ns, the improvement of energy and latency are achieved by 42% and 64% with only 3.4% accuracy loss on average for image processing benchmarks.
摘要近似计算被广泛用于降低系统的功耗和面积消耗,因为现在有许多容错多媒体应用。类nand自旋-轨道转矩磁隧道结(SOT-MTJ)作为一种新型的非易失性多比特存储器件,具有高速、高面积效率的特点,具有位置相关的随机开关机制,通过减小写入脉冲宽度,可以实现高有效位(hsb) 100%的存储精度,同时近似地存储低有效位(LSBs)。因此,它非常适合于数据的近似存储和更新。在这项工作中,我们提出了一种基于类似nand的SOT MRAM的质量可配置的最后一级缓存,利用与位置相关的随机开关,其中写入脉冲宽度用作精确存储和近似存储之间切换的精度旋钮。为了适应新的cell结构和应用场景,设计了高效的写操作和特定的管道读策略。为了评估该方案的性能,使用了电路级仿真模型NVSim和一组近似计算基准Axbench。通过将类nand SOT MTJs的写入脉冲宽度从3ns减少到1ns,在图像处理基准测试中,能量和延迟分别提高了42%和64%,平均精度损失仅为3.4%。
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.