{"title":"Multiscale Edge-Enhanced Deep Learning for Cable Connection Visual Inspection of Low-Voltage Switchgear","authors":"Yigeng Wang;Feng Zou;Lexuan Lai;Nian Cai;Wenzhao Liang","doi":"10.1109/TIM.2025.3608344","DOIUrl":null,"url":null,"abstract":"Correct cable connection is critical for safe and reliable operation of the low-voltage switchgear but currently relies on time-consuming and labor-intensive manual inspection. To improve inspection accuracy and efficiency, a novel multiscale edge-enhanced deep learning (MEDL) framework is designed to visually inspect cable connections in a dense cable scenario. Specifically, the MEDL detects the keypoints at the cable–terminal junctions through an encoder–decoder architecture with an edge enhancement (EE) module and a multiscale feature extraction (MSFE) module, followed by a matching stage. The EE module is designed to highlight the edges of the cables, which can, to some extent, suppress environmental interferences. The MSFE module is designed to extract multiscale features at the cable–terminal junctions while guiding the MEDL model to focus on the target regions. In the matching stage, the HDBSCAN is combined with a shared nearest neighbor (SNN) distance metric to cluster candidate keypoints for keypoint matching. The experimental results on cable connection images acquired in real-world scenarios demonstrate the superiority of the MEDL to some existing deep learning methods, achieving a matching accuracy (MA) of 0.9463 at an acceptable inspection speed.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-12"},"PeriodicalIF":5.9000,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11156102/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Correct cable connection is critical for safe and reliable operation of the low-voltage switchgear but currently relies on time-consuming and labor-intensive manual inspection. To improve inspection accuracy and efficiency, a novel multiscale edge-enhanced deep learning (MEDL) framework is designed to visually inspect cable connections in a dense cable scenario. Specifically, the MEDL detects the keypoints at the cable–terminal junctions through an encoder–decoder architecture with an edge enhancement (EE) module and a multiscale feature extraction (MSFE) module, followed by a matching stage. The EE module is designed to highlight the edges of the cables, which can, to some extent, suppress environmental interferences. The MSFE module is designed to extract multiscale features at the cable–terminal junctions while guiding the MEDL model to focus on the target regions. In the matching stage, the HDBSCAN is combined with a shared nearest neighbor (SNN) distance metric to cluster candidate keypoints for keypoint matching. The experimental results on cable connection images acquired in real-world scenarios demonstrate the superiority of the MEDL to some existing deep learning methods, achieving a matching accuracy (MA) of 0.9463 at an acceptable inspection speed.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.