V. Suresh Babu, M. Sathya, R. Uma Maheshwari, K. J. Subha
{"title":"Deepfake Detection Utilizing Enhanced Silicon-Based Physically Unclonable Functions Integrated with Photonic Crystal Fiber Sensor","authors":"V. Suresh Babu, M. Sathya, R. Uma Maheshwari, K. J. Subha","doi":"10.1007/s12633-025-03377-6","DOIUrl":null,"url":null,"abstract":"<div><p>This study introduces an advanced silicon-based physically unclonable function (PUF) integrated with Photonic Crystal Fiber (PCF) sensors, aimed at enhancing the robustness and reliability in deepfake detection devices. Leveraging the inherent unpredictability of silicon-based Physical Unclonable Functions (PUFs), combined with the sensitivity of PCF sensors, we propose a novel system for secure, accurate deepfake image detection utilizing hybrid Convolutional Neural Networks (CNN) and Long Short-Term Memory (LSTM) networks. The proposed architecture demonstrates significant improvement, achieving an average detection accuracy of 98.6%, surpassing existing models by 7.3%. Additionally, our integrated approach exhibits enhanced robustness, reducing false-positive rates by 15% and false negatives by 13.2% compared to conventional methods. Experimental evaluations confirm that the integration of silicon-based PUFs with PCF sensors not only strengthens the resilience against adversarial attacks but also enhances reliability under varying environmental conditions. This work offers a promising pathway toward advanced, secure, and high-performance deepfake detection solutions, suiTable for real-world deployment in cybersecurity applications.</p></div>","PeriodicalId":776,"journal":{"name":"Silicon","volume":"17 12","pages":"2815 - 2833"},"PeriodicalIF":3.3000,"publicationDate":"2025-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Silicon","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1007/s12633-025-03377-6","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"CHEMISTRY, PHYSICAL","Score":null,"Total":0}
引用次数: 0
Abstract
This study introduces an advanced silicon-based physically unclonable function (PUF) integrated with Photonic Crystal Fiber (PCF) sensors, aimed at enhancing the robustness and reliability in deepfake detection devices. Leveraging the inherent unpredictability of silicon-based Physical Unclonable Functions (PUFs), combined with the sensitivity of PCF sensors, we propose a novel system for secure, accurate deepfake image detection utilizing hybrid Convolutional Neural Networks (CNN) and Long Short-Term Memory (LSTM) networks. The proposed architecture demonstrates significant improvement, achieving an average detection accuracy of 98.6%, surpassing existing models by 7.3%. Additionally, our integrated approach exhibits enhanced robustness, reducing false-positive rates by 15% and false negatives by 13.2% compared to conventional methods. Experimental evaluations confirm that the integration of silicon-based PUFs with PCF sensors not only strengthens the resilience against adversarial attacks but also enhances reliability under varying environmental conditions. This work offers a promising pathway toward advanced, secure, and high-performance deepfake detection solutions, suiTable for real-world deployment in cybersecurity applications.
期刊介绍:
The journal Silicon is intended to serve all those involved in studying the role of silicon as an enabling element in materials science. There are no restrictions on disciplinary boundaries provided the focus is on silicon-based materials or adds significantly to the understanding of such materials. Accordingly, such contributions are welcome in the areas of inorganic and organic chemistry, physics, biology, engineering, nanoscience, environmental science, electronics and optoelectronics, and modeling and theory. Relevant silicon-based materials include, but are not limited to, semiconductors, polymers, composites, ceramics, glasses, coatings, resins, composites, small molecules, and thin films.