{"title":"Efficient Reconstruction for Dual Profilometry","authors":"Junzheng Peng;Wenlong Shao;Manhong Yao;Jian Liu;Shiping Li;Jingang Zhong","doi":"10.1109/TIM.2025.3604950","DOIUrl":null,"url":null,"abstract":"Fringe projection profilometry (FPP) has emerged as a widely used noncontact 3-D measurement technique due to its full-field acquisition, high precision, and rapid measurement capabilities. However, its performance degrades significantly when measuring objects with complex surface reflection characteristics, as light undergoes interreflection and subsurface scattering during measurement, generating indirect light signals that lead to reconstruction errors. Dual profilometry, a computational 3-D profilometry based on dual photography theory, overcomes this limitation by treating each camera pixel as a single-pixel detector to isolate the direct light signals. While theoretically effective, existing implementations need the reconstruction of millions of dual images. To overcome this limitation, we present an efficient reconstruction method that avoids dual image reconstruction. Experimental validation demonstrates that the reconstruction speed can be substantially improved compared with existing dual profilometry implementations, achieved without compromising reconstruction accuracy. The proposed method effectively resolves the efficiency bottleneck that has hindered the practical adoption of dual profilometry, enabling its deployment in practical applications such as industrial inspection and high-resolution biomedical surface characterization.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-19"},"PeriodicalIF":5.9000,"publicationDate":"2025-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11146872/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Fringe projection profilometry (FPP) has emerged as a widely used noncontact 3-D measurement technique due to its full-field acquisition, high precision, and rapid measurement capabilities. However, its performance degrades significantly when measuring objects with complex surface reflection characteristics, as light undergoes interreflection and subsurface scattering during measurement, generating indirect light signals that lead to reconstruction errors. Dual profilometry, a computational 3-D profilometry based on dual photography theory, overcomes this limitation by treating each camera pixel as a single-pixel detector to isolate the direct light signals. While theoretically effective, existing implementations need the reconstruction of millions of dual images. To overcome this limitation, we present an efficient reconstruction method that avoids dual image reconstruction. Experimental validation demonstrates that the reconstruction speed can be substantially improved compared with existing dual profilometry implementations, achieved without compromising reconstruction accuracy. The proposed method effectively resolves the efficiency bottleneck that has hindered the practical adoption of dual profilometry, enabling its deployment in practical applications such as industrial inspection and high-resolution biomedical surface characterization.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.