J. Manrique , D.M. Díaz Pace , J.A. Aguilera , C. Aragón
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引用次数: 0
Abstract
Stark widths and shifts of Nb II spectral lines have been measured by laser-induced breakdown spectroscopy (LIBS). The experimental line profiles are obtained from spectra of the emission of laser-induced plasmas generated with samples prepared by borate fusion with small niobium concentrations, selected to minimize self-absorption. Using different time delays in the detection of the emission, electron densities ranging from 0.81 × 1017 cm−3 to 6.7 × 1017 cm−3 and temperatures in the interval 10,100–16,700 K are employed in each measurement. The 26 Stark widths and 22 Stark shifts determined include spectral lines from transitions between 10 multiplets and 3 configurations. To our knowledge, only two experimental data for Nb II Stark widths were available previously in the literature.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.