{"title":"Far side defect detection in composite materials through threshold dynamics effect of local defect resonance frequency","authors":"Manish Sharma, Tanmoy Bose","doi":"10.1016/j.infrared.2025.106152","DOIUrl":null,"url":null,"abstract":"<div><div>Detection of deeper defects (depth more than mid layer thickness) are found to be challenging in local defect resonance (LDR) based non-destructive testing methods. In this paper, threshold dynamics in LDR is utilized for inspection of deeper defects in sweep vibro-thermography (SVT). First, CFRP composite samples are fabricated using vacuum assisted resin transfer moulding (VARTM) method. In first sample, a flat bottom hole (FBH) is created, and a barely visible impacts damage (BVID) is created in the second sample with an in-house developed portable impactor. The impacted CFRP sample is inspected using X-ray computed tomography (CT). Then, LDR based laser Doppler vibrometry (LDV) has been performed to understand the threshold dynamics in case of FBH. Thereafter, SVT has been used for inspection of BVID from the near and far (or, deeper) side. In both cases, a circular piezoelectric disc is used to vibrate the sample with desired resonance frequency range and voltages. The specimens are tested with six different voltage level. It has been found that temperature in the near side increases with an increase in input voltage to a certain voltage level. Thereafter, the temperature decreases with an increase in input voltage. In case of far or deeper side, the defect is found to be visible above that threshold voltage. Parametric resonance is found to be responsible for this observation which drains the energy from the fundamental LDR frequency to higher and fractional harmonics. Threshold dynamics effect is utilised to visualise far side defect in composite sample.</div></div>","PeriodicalId":13549,"journal":{"name":"Infrared Physics & Technology","volume":"151 ","pages":"Article 106152"},"PeriodicalIF":3.4000,"publicationDate":"2025-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared Physics & Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1350449525004451","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Detection of deeper defects (depth more than mid layer thickness) are found to be challenging in local defect resonance (LDR) based non-destructive testing methods. In this paper, threshold dynamics in LDR is utilized for inspection of deeper defects in sweep vibro-thermography (SVT). First, CFRP composite samples are fabricated using vacuum assisted resin transfer moulding (VARTM) method. In first sample, a flat bottom hole (FBH) is created, and a barely visible impacts damage (BVID) is created in the second sample with an in-house developed portable impactor. The impacted CFRP sample is inspected using X-ray computed tomography (CT). Then, LDR based laser Doppler vibrometry (LDV) has been performed to understand the threshold dynamics in case of FBH. Thereafter, SVT has been used for inspection of BVID from the near and far (or, deeper) side. In both cases, a circular piezoelectric disc is used to vibrate the sample with desired resonance frequency range and voltages. The specimens are tested with six different voltage level. It has been found that temperature in the near side increases with an increase in input voltage to a certain voltage level. Thereafter, the temperature decreases with an increase in input voltage. In case of far or deeper side, the defect is found to be visible above that threshold voltage. Parametric resonance is found to be responsible for this observation which drains the energy from the fundamental LDR frequency to higher and fractional harmonics. Threshold dynamics effect is utilised to visualise far side defect in composite sample.
期刊介绍:
The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region.
Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine.
Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.