Back Cover: Explicit Formulas for Estimating Trace of Reduced Density Matrix Powers via Single-Circuit Measurement Probabilities (Adv. Quantum Technol. 9/2025)

Abstract

The cover picture shows a controlled SWAP test quantum circuit with several state copies, and bitstrings (e.g., 0000, 1001, 1111) as measurement results. These bitstrings correspond to probabilities to simultaneously estimate traces of the 2nd to nth power traces of reduced density matrices via a single circuit, applied to entanglement measure computation. More in article number 2500376, Ming Li and co-workers.