Chengzhi Xu , Peiyuan Fu , Gefu Wang , Xufeng Liao , Lianxi Liu
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引用次数: 0
Abstract
—Level shifters play a crucial role in high-frequency switched-mode power supplies (SMPS). In GaN-based SMPS systems where switching nodes experience rapid transitions, two critical parameters determine level shifter performance: propagation delay and common-mode transient immunity (CMTI). While conventional approaches to improve CMTI typically employ noise filters, these solutions often introduce substantial propagation delays. To address this limitation, we present a high-speed level shifter design featuring an adaptive positive dv/dt noise blanker. This solution operates based on the converter's working principle, effectively blocking noise paths during fast switching transitions without compromising delay performance. Implemented in 0.18 μm Bipolar-CMOS-DMOS (BCD) process, the simulation and measurement results of the proposed design show a delay of 0.937 ns and 400 V/ns of dV/dt CMTI at floating voltage 50 V.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.