V. I. Bondarenko, S. S. Rekhviashvili, F. N. Chukhovskii
{"title":"Computer Diffraction Tomography. Digital Image Processing and Analysis Based on the 1D-, 2D-Sized Guided and Wavelet-Function Filter Processing","authors":"V. I. Bondarenko, S. S. Rekhviashvili, F. N. Chukhovskii","doi":"10.1134/S1063774525600735","DOIUrl":null,"url":null,"abstract":"<p>The results of computer processing for plane-wave X-ray topography imaging of a Coulomb-type point defect in a Si(111) crystal, recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechies atomic function, are presented and analyzed. The topography image filtering efficiency is determined by the parameter of the relative square deviations (averaged over all pixels) of the pixel intensities (RMS) of the processed and reference (noise-free) 2D images. Practical methods for selecting filtration parameters are proposed, with the aid of which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their subsequent use for the 3D digital recovering of nanosized crystal defects.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 4","pages":"523 - 531"},"PeriodicalIF":0.5000,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Crystallography Reports","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1134/S1063774525600735","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"CRYSTALLOGRAPHY","Score":null,"Total":0}
引用次数: 0
Abstract
The results of computer processing for plane-wave X-ray topography imaging of a Coulomb-type point defect in a Si(111) crystal, recorded by an X-ray detector against a background of the Gaussian noise, and their subsequent filtering using the 1D-, 2D-sized guided and a heuristic wavelet 4th-order Daubechies atomic function, are presented and analyzed. The topography image filtering efficiency is determined by the parameter of the relative square deviations (averaged over all pixels) of the pixel intensities (RMS) of the processed and reference (noise-free) 2D images. Practical methods for selecting filtration parameters are proposed, with the aid of which the considered methods work well enough to be used in practice for the noise processing of plane-wave X-ray topography images, meaning their subsequent use for the 3D digital recovering of nanosized crystal defects.
期刊介绍：
Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
