Yichen Yan;Gaiyun He;Chenyu Wu;Sitong Wang;Zhi Tan;Yue Yang
{"title":"Automatic Inspection Planning Method for Complex Surfaces on a Contact-Scanning Coordinate Measuring Machine","authors":"Yichen Yan;Gaiyun He;Chenyu Wu;Sitong Wang;Zhi Tan;Yue Yang","doi":"10.1109/TIM.2025.3602580","DOIUrl":null,"url":null,"abstract":"The growing use of complex surfaces in various industries has intensified the demand for accurate and efficient surface quality measurements. Contact-scanning inspection on the coordinate measuring machine (CMM) has become one of the key technologies for measuring complex surfaces with high precision. However, developing an automatic inspection plan that balances adaptability, safety, and efficiency remains challenging. This article introduces an automatic inspection planning method that uses two key strategies: the sawtooth adaptive sampling (SS) strategy and the probing orientation and path planning (OP) strategy. The SS strategy is used to distribute sawtooth scanning lines both globally and locally based on multiple surface information. The OP strategy is used to plan probing orientations for each scanning line, accounting for potential interferences. To optimize local and global inspection paths, we propose an improved ant colony optimization (IACO-IC) that incorporates interference costs. A series of experiments verifies that the proposed method reduces the total inspection time by 14.8% and unnecessary transition distances by more than 46.8% while maintaining the highest sampling accuracy and avoiding potential interference. This contribution enhances the inspection efficiency of complex surfaces and further improves manufacturing capability.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-11"},"PeriodicalIF":5.9000,"publicationDate":"2025-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11145044/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The growing use of complex surfaces in various industries has intensified the demand for accurate and efficient surface quality measurements. Contact-scanning inspection on the coordinate measuring machine (CMM) has become one of the key technologies for measuring complex surfaces with high precision. However, developing an automatic inspection plan that balances adaptability, safety, and efficiency remains challenging. This article introduces an automatic inspection planning method that uses two key strategies: the sawtooth adaptive sampling (SS) strategy and the probing orientation and path planning (OP) strategy. The SS strategy is used to distribute sawtooth scanning lines both globally and locally based on multiple surface information. The OP strategy is used to plan probing orientations for each scanning line, accounting for potential interferences. To optimize local and global inspection paths, we propose an improved ant colony optimization (IACO-IC) that incorporates interference costs. A series of experiments verifies that the proposed method reduces the total inspection time by 14.8% and unnecessary transition distances by more than 46.8% while maintaining the highest sampling accuracy and avoiding potential interference. This contribution enhances the inspection efficiency of complex surfaces and further improves manufacturing capability.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.