Zhiwei Hao,Jianyuan Guo,Kai Han,Han Hu,Chang Xu,Yunhe Wang
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引用次数: 0
Abstract
The spectacular success of training large models on extensive datasets highlights the potential of scaling up for exceptional performance. To deploy these models on edge devices, knowledge distillation (KD) is commonly used to create a compact model from a larger, pretrained teacher model. However, as models and datasets rapidly scale up in practical applications, it is crucial to consider the applicability of existing KD approaches originally designed for limited-capacity architectures and small-scale datasets. In this paper, we revisit current KD methods and identify the presence of a small-data pitfall, where most modifications to vanilla KD prove ineffective on large-scale datasets. To guide the design of consistently effective KD methods across different data scales, we conduct a meticulous evaluation of the knowledge transfer process. Our findings reveal that incorporating more useful information is crucial for achieving consistently effective KD methods, while modifications in loss functions show relatively less significance. In light of this, we present a paradigmatic example that combines vanilla KD with deep supervision, incorporating additional information into the student during distillation. This approach surpasses almost all recent KD methods. We believe our study will offer valuable insights to guide the community in navigating beyond the small-data pitfall and toward consistently effective KD.
期刊介绍:
The IEEE Transactions on Pattern Analysis and Machine Intelligence publishes articles on all traditional areas of computer vision and image understanding, all traditional areas of pattern analysis and recognition, and selected areas of machine intelligence, with a particular emphasis on machine learning for pattern analysis. Areas such as techniques for visual search, document and handwriting analysis, medical image analysis, video and image sequence analysis, content-based retrieval of image and video, face and gesture recognition and relevant specialized hardware and/or software architectures are also covered.