M. N. Shipko, M. A. Stepovich, A. V. Khlyustova, N. A. Sirotkin, T. P. Kaminskaya, A. V. Stulov, E. S. Savchenko
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引用次数: 0
Abstract
Using scanning electron, optical, and scanning probe microscopy, the surface structure of unannealed amorphous electrical engineering alloys—foils with the composition Fe73(SiBNb)27 and alloys of the same composition with the addition of 1% Cu, obtained by ultrafast cooling via melt spinning onto a rotating copper drum—was studied. On the free surfaces of the foils not in contact with the rotating drum, microformations and irregularities in the form of “micropoints” with characteristic sizes below 0.5 μm were found; these may, during the operation of electrical products, initiate electric field gradients on the foil surface. Exposure to underwater plasma did not lead to any change in the magnetic properties of the studied materials. In the Fe73(SiBNb)27 foil with the addition of 1% Cu, treated with 10 and 40 pulses of a low-frequency (10–20 Hz), weak magnetic field (10–100 kA/m), magnetic contrast was observed: in phase contrast mode, exposure to 40 magnetic field pulses produced triangular features associated with the formation of closing prismatic domains, whose domain wall width is approximately 1–2 μm; after exposure to 10 magnetic field pulses, a specific magnetic contrast pattern was observed over the entire studied foil area. A weak dependence of specific magnetization on the number of magnetic pulses was also observed for the Fe73(SiBNb)27 foil with 1% Cu: increasing the number of pulses led to a slight decrease in specific magnetization.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.