Contemporary Phase and Achievements of the X-ray Computer Diffraction Microtomography

Abstract

Over the last few decades, high-resolution X-ray imaging recorded with the X-ray phase-absorption ptychography and coherent diffraction microtomography techniques has become an effective tool for investigating nanoscale structures and crystal-lattice defects. Both methods provide lensless high-resolution X-ray imaging and are a powerful alternative to X-ray lens optics. Here, one reports novel achievements in decoding the crystal-lattice defects by computer X-ray diffraction microtomography.