Anomaly in the Interaction between Microfocus Bremsstrahlung from a New 18 MeV Betatron-Based Source and a Sharp Edge of a Steel Plate

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
M. M. Rychkov, V. V. Kaplin, V. A. Smolyanskii
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引用次数: 0

Abstract

Images of the distribution of microfocus bremsstrahlung from a new source based on an 18 MeV betatron, which has passed a 0.4 mm thick steel plate with a 1.2 mm wide sharp edge, are presented. The photographs demonstrate an anomaly in the interaction between the microfocus bremsstrahlung and the plate tip in the form of a narrow dark stripe along the tip image, which indicates an increase in the radiation intensity in this area. The dark stripe provides a contrast in the tip image, which, together with the high sharpness due to the microfocus of the source, allows the tip position to be visualized with high precision. The dark stripe in the images was not observed when using radiation from 450 and 45 keV X-ray tubes with foci of 400 and 100 µm. The absorption of radiation ensures a smooth change in the blackening of the sharp edge and blurring of the tip in the image due to the size of the radiation source. The observed effect with microfocus radiation of the new source is determined by the scattering of radiation by the tip with the possible participation of wave effects, which needs to be further investigated.

Abstract Image

Abstract Image

新型18mev betattron源微聚焦轫致辐射与钢板锐边相互作用的异常
本文给出了一种基于18mev电子感应加速器的新型源微聚焦轫致辐射的分布图像,该源通过了0.4 mm厚、1.2 mm宽锐边的钢板。照片显示微聚焦轫致辐射与平板尖端之间的相互作用异常,在尖端图像上形成一条狭窄的暗条纹,表明该区域的辐射强度增加。暗条纹在尖端图像中提供了对比,这与由于源的微聚焦而产生的高清晰度一起,使得尖端位置能够以高精度可视化。当使用450 keV和45 keV x射线管,聚焦400和100µm时,未观察到图像中的暗条纹。由于辐射源的大小,辐射的吸收确保了图像中尖锐边缘的变黑和尖端的模糊的平滑变化。观测到的新光源微聚焦辐射效应是由尖端对辐射的散射决定的,可能会有波效应的参与,这需要进一步研究。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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