{"title":"Mechanisms of the Volume Capture of Fast Charged Particles in a Curved Single Crystal","authors":"E. A. Mazur","doi":"10.1134/S1027451025700387","DOIUrl":null,"url":null,"abstract":"<p>The effect of the volume capture of fast charged particles in a curved single crystal is studied. The transverse energy losses, the hovering effect, and the criterion for the volume capture of fast charged particles are studied. Possible mechanisms of volume capture are considered: transverse energy losses due to crystal excitation by a fast charged particle (proton, lepton), multiple scattering of particles in a curved crystal, and elastic scattering and diffraction of particles in a curved crystal. It is shown that in the hovering region, the ratio of the loss rates of the transverse and longitudinal energy of fast charged particles increases significantly compared to the ratio of the longitudinal and transverse energies and is equal in order of magnitude to the ratio of the off-diagonal elements of the inverse dielectric permittivity matrix to the diagonal ones. It is established that the effect of the volume capture of fast protons (leptons) is due to diffraction in a curved crystal, as well as the effects of damping of the off-diagonal elements of the particle density matrix. The proposed diffraction mechanism is based on taking into account the quantum coherent scattering of a fast proton (lepton) in a curved crystal.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"19 2","pages":"276 - 284"},"PeriodicalIF":0.4000,"publicationDate":"2025-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451025700387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The effect of the volume capture of fast charged particles in a curved single crystal is studied. The transverse energy losses, the hovering effect, and the criterion for the volume capture of fast charged particles are studied. Possible mechanisms of volume capture are considered: transverse energy losses due to crystal excitation by a fast charged particle (proton, lepton), multiple scattering of particles in a curved crystal, and elastic scattering and diffraction of particles in a curved crystal. It is shown that in the hovering region, the ratio of the loss rates of the transverse and longitudinal energy of fast charged particles increases significantly compared to the ratio of the longitudinal and transverse energies and is equal in order of magnitude to the ratio of the off-diagonal elements of the inverse dielectric permittivity matrix to the diagonal ones. It is established that the effect of the volume capture of fast protons (leptons) is due to diffraction in a curved crystal, as well as the effects of damping of the off-diagonal elements of the particle density matrix. The proposed diffraction mechanism is based on taking into account the quantum coherent scattering of a fast proton (lepton) in a curved crystal.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.