Action of a High-Power Ion Beam of Nanosecond Duration on Commercial AlN Ceramics

IF 0.4 Q4 PHYSICS, CONDENSED MATTER
V. S. Kovivchak
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Abstract

The fracture and change in the elemental composition of the surface layers of aluminum nitride ceramics under the action of a high-power ion beam of nanosecond duration have been studied. The spatial characteristics of ceramics surface fracture have been determined. The destruction occurs mainly along the boundaries of particles (crystallites) from which the ceramics is sintered. Complete removal of some of these particles from the surface layer is observed both after single and multiple irradiations with a current density of 150 A/cm2. The formation of hemispherical droplets of various sizes is detected both on the irradiated surface of the ceramics and on the surface after removal of the fracture fragment (after multiple irradiation). Depletion of the surface layer of the ceramics in nitrogen has been established. Possible mechanisms of the observed changes in the surface layer of the ceramics are discussed.

Abstract Image

Abstract Image

纳秒级高功率离子束对商用AlN陶瓷的作用
研究了高功率纳秒离子束作用下氮化铝陶瓷表层的断裂和元素组成的变化。测定了陶瓷表面断裂的空间特征。破坏主要发生在烧结陶瓷的颗粒(晶体)的边界上。在单次和多次以150 a /cm2的电流密度照射后,观察到其中一些颗粒从表层完全去除。在陶瓷辐照表面和断片去除后(多次辐照后)表面均检测到不同尺寸的半球形液滴的形成。在氮的作用下,陶瓷的表层发生损耗。讨论了观察到的陶瓷表层变化的可能机制。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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