{"title":"Study on betavoltaic battery with suspended 1.5 µm-Si thin film back-junction back-contact PN junction","authors":"Bo Wu, Meng Wu, Jinwen Zhang","doi":"10.1016/j.sna.2025.117031","DOIUrl":null,"url":null,"abstract":"<div><div>This paper investigated the structural and area influence on the fabrication yield and the characteristics of the diode and betavoltaic battery. Different structures and areas of the back-junction back-contact (BJBC) PN junction with suspended 1.5 µm-Si thin-film were prepared by microfabrication based on silicon-on-insulator (SOI) substrates. The samples were fixed and wire-bonded on a custom-designed-and-processed sample holder and PCB board on the SEM stage so that their betavoltaic battery performance was tested using high-energy electron beams to simulate the tritium source. Before splintered to chips, all devices on the 4-inch wafer maintained their structures well and exhibited good rectification characteristics. However, the larger area the suspended thin film was, the more severely it was damaged after splintering. The collection efficiency of radiation-generated carriers were enhanced by reducing collection electrode spacing and increasing the number of electrodes, thereby improving the battery performance, which proves the advantage of design flexibility in doping regions and electrode shapes in BJBC structures. The large device area made the reverse saturation current of the PN junction decreasing an order of magnitude and so resulted in the betavoltaic battery performance degradation. As a result, the optimal betavoltaic battery performance was achieved by 1.2 × 1.2 mm<sup>2</sup> area BJBC PN junction with the interdigitated structure of 10 µm-wide P⁺/N⁺ regions and 25 µm spacing, yielding <em>I</em><sub><em>sc</em></sub> = 0.729 µA, <em>V</em><sub><em>oc</em></sub> = 0.194 V, <em>P</em><sub><em>m</em></sub> = 84.1 nW, <em>η</em> = 1.09 %.</div></div>","PeriodicalId":21689,"journal":{"name":"Sensors and Actuators A-physical","volume":"395 ","pages":"Article 117031"},"PeriodicalIF":4.9000,"publicationDate":"2025-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensors and Actuators A-physical","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0924424725008374","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This paper investigated the structural and area influence on the fabrication yield and the characteristics of the diode and betavoltaic battery. Different structures and areas of the back-junction back-contact (BJBC) PN junction with suspended 1.5 µm-Si thin-film were prepared by microfabrication based on silicon-on-insulator (SOI) substrates. The samples were fixed and wire-bonded on a custom-designed-and-processed sample holder and PCB board on the SEM stage so that their betavoltaic battery performance was tested using high-energy electron beams to simulate the tritium source. Before splintered to chips, all devices on the 4-inch wafer maintained their structures well and exhibited good rectification characteristics. However, the larger area the suspended thin film was, the more severely it was damaged after splintering. The collection efficiency of radiation-generated carriers were enhanced by reducing collection electrode spacing and increasing the number of electrodes, thereby improving the battery performance, which proves the advantage of design flexibility in doping regions and electrode shapes in BJBC structures. The large device area made the reverse saturation current of the PN junction decreasing an order of magnitude and so resulted in the betavoltaic battery performance degradation. As a result, the optimal betavoltaic battery performance was achieved by 1.2 × 1.2 mm2 area BJBC PN junction with the interdigitated structure of 10 µm-wide P⁺/N⁺ regions and 25 µm spacing, yielding Isc = 0.729 µA, Voc = 0.194 V, Pm = 84.1 nW, η = 1.09 %.
期刊介绍:
Sensors and Actuators A: Physical brings together multidisciplinary interests in one journal entirely devoted to disseminating information on all aspects of research and development of solid-state devices for transducing physical signals. Sensors and Actuators A: Physical regularly publishes original papers, letters to the Editors and from time to time invited review articles within the following device areas:
• Fundamentals and Physics, such as: classification of effects, physical effects, measurement theory, modelling of sensors, measurement standards, measurement errors, units and constants, time and frequency measurement. Modeling papers should bring new modeling techniques to the field and be supported by experimental results.
• Materials and their Processing, such as: piezoelectric materials, polymers, metal oxides, III-V and II-VI semiconductors, thick and thin films, optical glass fibres, amorphous, polycrystalline and monocrystalline silicon.
• Optoelectronic sensors, such as: photovoltaic diodes, photoconductors, photodiodes, phototransistors, positron-sensitive photodetectors, optoisolators, photodiode arrays, charge-coupled devices, light-emitting diodes, injection lasers and liquid-crystal displays.
• Mechanical sensors, such as: metallic, thin-film and semiconductor strain gauges, diffused silicon pressure sensors, silicon accelerometers, solid-state displacement transducers, piezo junction devices, piezoelectric field-effect transducers (PiFETs), tunnel-diode strain sensors, surface acoustic wave devices, silicon micromechanical switches, solid-state flow meters and electronic flow controllers.
Etc...