Ying Wang , Lixun Wang , Yuejun Zhang , Yi Gong , Hanyu Shi , Huihong Zhang , Pengjun Wang
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引用次数: 0
Abstract
Epilepsy, a prevalent neurological disorder requiring low-cost rapid detection in wearable devices, prompts this study to propose a channel attention mechanism(CAM) and convolutional neural network(CNN) hybrid framework that mitigates redundant electroencephalogram(EEG) channel interference and enhances cross-patient generalization through dynamic channel selection. The framework uses CAM to dynamically selects high-information EEG channels across patients/timepoints, eliminating redundancy through feature interaction analysis and feeds them into the CNN to carry out the feature extraction and classification.Then, lightweight processing means such as global average pooling(GAP) and dilated convolution are used to reduce the number of neurons and network complexity, and parallelisation means such as bitonic sorting and pulsed arrays are combined to achieve low-latency effects. Moreover, the hardware IP is designed under the 16-bit mixed-precision fixed-point coding and serial-parallel combination architecture. Implemented on TSMC 65nm process, the design achieves 97.1% accuracy with 77% storage reduction, 1.38mm2 core area, and 37.28μs latency (5-10× faster than others) at 0.206μJ/class energy efficiency under 1V/20MHz conditions.
期刊介绍:
Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems.
The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc.
Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.