Aditya Soni , Sagar Juneja , M. Elangovan , Kulbhushan Sharma
{"title":"Design of a SRAM memory cell with enhanced stability and variability for embedded biomedical applications","authors":"Aditya Soni , Sagar Juneja , M. Elangovan , Kulbhushan Sharma","doi":"10.1016/j.vlsi.2025.102537","DOIUrl":null,"url":null,"abstract":"<div><div>Embedded biomedical applications need low-power of operation and high-speed to meet the requirements of portability and fast response time. This can be achieved by improving the design of embedded memories. An SRAM cell has been reported in this work with eleven 18 nm FinFET devices. To minimize the write delay, transmission gate approach is used, which also improves the variability performance as analyzed through Monte Carlo simulations. Leakage control transistors and pmos-pmos-nmos (PPN) based inverters have been incorporated to reduce power and improve pull-up strength, respectively. Read decoupling technique has been used to separate the read-write operations. Titled as 11TLCTG SRAM cell, the design is analyzed using Cadence Virtuoso tool and the effects of process corners-voltage-temperature (PVT) variations are studied as well. It has a power consumption of 18.01 nW, 20.91 nW, and 3.58 μW during write, hold and read operations, respectively, and has excellent stability parameter values. Its write stability is 1.36x, 1.47x, 1.23x, 5.54x and 1.09x better and read stability is 2x, 1.04x, 1.04x, 1.23x, and 2.09x better than that of the contemporary designs considered for comparison purposes. The proposed design occupies the area of 4.7 μm<sup>2</sup> and mitigates half select issues, which makes it ideal for building large memory arrays.</div></div>","PeriodicalId":54973,"journal":{"name":"Integration-The Vlsi Journal","volume":"105 ","pages":"Article 102537"},"PeriodicalIF":2.5000,"publicationDate":"2025-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Integration-The Vlsi Journal","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167926025001944","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
Embedded biomedical applications need low-power of operation and high-speed to meet the requirements of portability and fast response time. This can be achieved by improving the design of embedded memories. An SRAM cell has been reported in this work with eleven 18 nm FinFET devices. To minimize the write delay, transmission gate approach is used, which also improves the variability performance as analyzed through Monte Carlo simulations. Leakage control transistors and pmos-pmos-nmos (PPN) based inverters have been incorporated to reduce power and improve pull-up strength, respectively. Read decoupling technique has been used to separate the read-write operations. Titled as 11TLCTG SRAM cell, the design is analyzed using Cadence Virtuoso tool and the effects of process corners-voltage-temperature (PVT) variations are studied as well. It has a power consumption of 18.01 nW, 20.91 nW, and 3.58 μW during write, hold and read operations, respectively, and has excellent stability parameter values. Its write stability is 1.36x, 1.47x, 1.23x, 5.54x and 1.09x better and read stability is 2x, 1.04x, 1.04x, 1.23x, and 2.09x better than that of the contemporary designs considered for comparison purposes. The proposed design occupies the area of 4.7 μm2 and mitigates half select issues, which makes it ideal for building large memory arrays.
期刊介绍:
Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics:
Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.