Lei Wang;Cheng Xi Zhang;ShuaiShuai Xing;Yuan Hang Xu;Wei Bing Kong;Jin Shi
{"title":"A Low-Profile Shared-Aperture Patch Antenna With 2-D Scanning Capability","authors":"Lei Wang;Cheng Xi Zhang;ShuaiShuai Xing;Yuan Hang Xu;Wei Bing Kong;Jin Shi","doi":"10.1109/LAWP.2025.3578513","DOIUrl":null,"url":null,"abstract":"This letter presents a novel low-profile patch antenna with shared aperture and two-dimensional scanning capability. Compared with the state-of-the-art designs, the proposed antenna offers low cost and easy integration due to its simple structure. The millimeter-wave (MMW) stacked patch antenna array is embedded in the weak electric-field (<italic>E</i>-field) region of the antiphase TM<sub>20</sub> mode and TM<sub>12</sub> mode of the microwave (MW) dual-patch antenna. This design interleaves two antenna types within the same aperture, achieving natural isolation. Slots on the MW patch modify the current path of the antiphase TM<sub>20</sub> mode and the TM<sub>12</sub> mode, enabling dual-mode operation with low profile. The stacked patches provide wideband operation in MMW frequency band. Additionally, periodic slots on the MW patch facilitate MMW beam scanning, achieving ±45° beam scanning at both <italic>E</i>- and <italic>H</i>-planes. For demonstration, a prototype of the proposed MW and MMW shared-aperture patch antenna is fabricated and measured, which has a total size of 0.38λ<sub>L</sub> × 0.48<italic>λ</i><sub>L</sub> × 0.022<italic>λ</i><sub>L</sub> (<italic>λ</i><sub>L</sub> is the operating wavelength at 4.6 GHz in free space). Measurements show a 10 dB impedance matching bandwidth of 6.6% and 27.1% and a peak gain of 7.2 dBi and 15.5 dBi in MW and MMW bands, respectively.","PeriodicalId":51059,"journal":{"name":"IEEE Antennas and Wireless Propagation Letters","volume":"24 9","pages":"2974-2978"},"PeriodicalIF":4.8000,"publicationDate":"2025-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Antennas and Wireless Propagation Letters","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/11029583/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This letter presents a novel low-profile patch antenna with shared aperture and two-dimensional scanning capability. Compared with the state-of-the-art designs, the proposed antenna offers low cost and easy integration due to its simple structure. The millimeter-wave (MMW) stacked patch antenna array is embedded in the weak electric-field (E-field) region of the antiphase TM20 mode and TM12 mode of the microwave (MW) dual-patch antenna. This design interleaves two antenna types within the same aperture, achieving natural isolation. Slots on the MW patch modify the current path of the antiphase TM20 mode and the TM12 mode, enabling dual-mode operation with low profile. The stacked patches provide wideband operation in MMW frequency band. Additionally, periodic slots on the MW patch facilitate MMW beam scanning, achieving ±45° beam scanning at both E- and H-planes. For demonstration, a prototype of the proposed MW and MMW shared-aperture patch antenna is fabricated and measured, which has a total size of 0.38λL × 0.48λL × 0.022λL (λL is the operating wavelength at 4.6 GHz in free space). Measurements show a 10 dB impedance matching bandwidth of 6.6% and 27.1% and a peak gain of 7.2 dBi and 15.5 dBi in MW and MMW bands, respectively.
期刊介绍:
IEEE Antennas and Wireless Propagation Letters (AWP Letters) is devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation. These are areas of competence for the IEEE Antennas and Propagation Society (AP-S). AWPL aims to be one of the "fastest" journals among IEEE publications. This means that for papers that are eventually accepted, it is intended that an author may expect his or her paper to appear in IEEE Xplore, on average, around two months after submission.