ATSS-PUF with hardware sharing for secure in-situ memory circuit

Abstract

Industrial Internet of Things (IoT) edge nodes urgently need encryption schemes that take into account key stability and hardware efficiency under low-power consumption and harsh working conditions, but existing technologies are limited by defects such as high key BER, high hardware resource overhead, and insufficient data security. To solve these problems, this paper proposes a four-mode reconfigurable in-situ memory unit, which accomplishes the hardware multiplexing of key generation, dynamic screening, heterodyne encryption and dense state storage functions, and combines the active time-tilted screening mechanism with the injection of controlled delayed perturbations into the symmetric path to screen the unstable key bits. The measured results demonstrate that the circuit PUF response drops to 1.9 % and 2.9 % BER under temperature fluctuation of −20 °C–80 °C and voltage perturbation of 0.7–1.2V, respectively, and the randomness of the PUF response reaches 99.8 %, the inter-slice Hamming distance reaches 49.57 %, the autocorrelation is only 0.0224, which passes the randomness test of NIST, and the capability of anti-side-channel attack and anti-brutal attack is provided.