A programmable delay chain for the source-synchronous interface

IF 2.5 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
Jen-Chieh Liu, Jun-Yu Chen, Wen-Qi Liu
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引用次数: 0

Abstract

This paper describes a 5 ps timing resolution programmable delay chain (PDC) comprising a coarse-tuning delay line (CT-DL) and fine-timing delay line (FT-DL) to enable the user to adjust the delay time. For the process, voltage and temperature variations (PVT variations), the digital delay-locked loop (Digital DLL), and the auto-calibration circuit ensure that the programmable delay time is constant. The CT-DL and FT-DL adjust the delay time with a 5 ps delay time interval, employing a MUX-based scheme and the MOS varactor to define the delay tuning range and timing resolution. The CT-DL's timing resolution is determined via the DLL's one delay cell, with the FT-DL using an auto-calibration circuit to maintain a constant timing resolution. Thus, the PDC achieves a programmable delay time under the PVT variations. The test chip was implemented in a 90 nm CMOS process and a maximum operating frequency of 1 GHz. The power consumption was less than 505 μW when the PDC input was 100 MHz and the delay time range was 1.5 ns with a resolution and average accuracy of 5 ps and ±0.29 LSB, respectively.
源同步接口的可编程延迟链
本文描述了一种5ps时序分辨率可编程延迟链(PDC),它由粗调谐延迟线(CT-DL)和精调谐延迟线(FT-DL)组成,使用户能够调节延迟时间。对于过程,电压和温度变化(PVT变化),数字延迟锁相环(digital DLL)和自动校准电路确保可编程延迟时间恒定。CT-DL和FT-DL以5ps的延迟时间间隔调整延迟时间,采用基于mux的方案和MOS变容器来定义延迟调谐范围和时序分辨率。CT-DL的时序分辨率通过DLL的一个延迟单元确定,FT-DL使用自动校准电路来保持恒定的时序分辨率。因此,PDC在PVT变化下实现了可编程延迟时间。测试芯片采用90 nm CMOS工艺,最高工作频率为1 GHz。当配电柜输入为100 MHz,延迟时间范围为1.5 ns时,功耗小于505 μW,分辨率和平均精度分别为5 ps和±0.29 LSB。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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