Cover Image, Volume 3, Number 3, August

Electron Pub Date : 2025-09-02 DOI:10.1002/elt2.70018
Shenglong Wei, Xiuheng Zhou, Xiaofeng Chen, Rongkun Chen, Feifan Ma, Yihong Chen, Vedaste Uwihoreye, Freddy E. Oropeza, Yongxing Liu, Likai Xun, Haihui Xin, Kaiyi Wu, Xitian Liu, Yongzhou Zhao, Kelvin H. L. Zhang
{"title":"Cover Image, Volume 3, Number 3, August","authors":"Shenglong Wei,&nbsp;Xiuheng Zhou,&nbsp;Xiaofeng Chen,&nbsp;Rongkun Chen,&nbsp;Feifan Ma,&nbsp;Yihong Chen,&nbsp;Vedaste Uwihoreye,&nbsp;Freddy E. Oropeza,&nbsp;Yongxing Liu,&nbsp;Likai Xun,&nbsp;Haihui Xin,&nbsp;Kaiyi Wu,&nbsp;Xitian Liu,&nbsp;Yongzhou Zhao,&nbsp;Kelvin H. L. Zhang","doi":"10.1002/elt2.70018","DOIUrl":null,"url":null,"abstract":"<p>Gallium nitride (GaN)-based micro- or mini- light-emitting diodes (micro-LEDs and mini-LEDs) have emerged as promising candidate for next-generation display technologies due to their high resolution, exceptional brightness, long lifetime and superior contrast ratio compared with traditional display technologies like liquid crystal displays (LCDs) and organic light-emitting diodes (OLEDs). V-pits play a vital role in enhancing performance in devices by affecting the quality of epitaxy wafer, the banding structure and carrier injection efficiency. In this cover image (DOI: 10.1002/elt2.70014), the study offers a systematic and comprehensive analysis of optical and electronic properties in LED chips affected by the V-pits coverage.\n <figure>\n <div><picture>\n <source></source></picture><p></p>\n </div>\n </figure></p>","PeriodicalId":100403,"journal":{"name":"Electron","volume":"3 3","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2025-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/elt2.70018","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electron","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/elt2.70018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Gallium nitride (GaN)-based micro- or mini- light-emitting diodes (micro-LEDs and mini-LEDs) have emerged as promising candidate for next-generation display technologies due to their high resolution, exceptional brightness, long lifetime and superior contrast ratio compared with traditional display technologies like liquid crystal displays (LCDs) and organic light-emitting diodes (OLEDs). V-pits play a vital role in enhancing performance in devices by affecting the quality of epitaxy wafer, the banding structure and carrier injection efficiency. In this cover image (DOI: 10.1002/elt2.70014), the study offers a systematic and comprehensive analysis of optical and electronic properties in LED chips affected by the V-pits coverage.

Abstract Image

封面图片,第三卷,第3期,8月
与液晶显示器(lcd)和有机发光二极管(oled)等传统显示技术相比,基于氮化镓(GaN)的微型或微型发光二极管(micro- led和mini- led)由于其高分辨率、高亮度、长寿命和优越的对比度而成为下一代显示技术的有希望的候选者。v坑通过影响外延片质量、带结构和载流子注入效率,对器件性能的提高起着至关重要的作用。在这张封面图片中(DOI: 10.1002/elt2.70014),该研究提供了一个系统和全面的分析,在LED芯片的光学和电子特性受v坑覆盖。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信