Development of a High-Performance of Cu-Doped SnS Thin Film for Broadband Flexible Photodetector

IF 4.3 4区 物理与天体物理 Q2 CHEMISTRY, PHYSICAL
Noor M. Ibrahim, Manal M. Abdullah, Mohamed S. Mahdi
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Abstract

Tin sulfide, particularly in its π-phase with a cubic crystal structure, has demonstrated significant potential for use in flexible photodetector applications due to its unique optoelectronic properties. However, its performance is often limited by low photocurrent and, consequently, low responsivity. This study addresses this challenge by introducing a novel approach to enhancing photodetector performance through copper doping. A thin film of copper-doped tin sulfide (SnS: Cu) was grown on a flexible polyester substrate using the cost-effective and straightforward chemical bath deposition (CBD) technique. The photoresponse measurements demonstrated an increase in responsivity of approximately 56 times compared to what was previously reported for undoped SnS thin films in our earlier study. Furthermore, the present photodetector exhibited a strong response across a wide range from UV to near-infrared illumination. X-ray diffraction (XRD) confirmed the preservation of the cubic SnS phase. Field emission scanning electron microscopy (FE-SEM) revealed a homogeneous, quasi-spherical grain structure. Energy-dispersive X-ray spectroscopy (EDX) confirmed the presence of Cu in the film, and the systematic shift of XRD peaks toward higher diffraction angles indicates that Cu is incorporated into the SnS lattice, consistent with substitutional doping. The optical measurements indicated a bandgap of 1.44 eV. The responsivity (R) and detectivity (D) were also calculated at 380 nm, 750 nm, and 850 nm. These findings underscore the potential of Cu-doped SnS thin films as next-generation flexible optoelectronic devices.

宽带柔性光电探测器用高性能掺铜SnS薄膜的研制
硫化锡,特别是其π相立方晶体结构的硫化锡,由于其独特的光电特性,在柔性光电探测器应用中显示出巨大的潜力。然而,它的性能往往受到低光电流和低响应性的限制。本研究通过引入一种通过铜掺杂提高光电探测器性能的新方法来解决这一挑战。利用化学浴沉积(CBD)技术,在柔性聚酯衬底上生长了一层掺杂铜的硫化锡(SnS: Cu)薄膜。光响应测量表明,与我们早期研究中未掺杂的SnS薄膜相比,其响应率增加了约56倍。此外,该光电探测器在紫外至近红外照明范围内表现出强烈的响应。x射线衍射(XRD)证实了立方SnS相的保存。场发射扫描电镜(FE-SEM)显示晶粒呈均匀的准球形结构。能量色散x射线光谱(EDX)证实了Cu在薄膜中的存在,XRD峰向更高衍射角的系统位移表明Cu被纳入到SnS晶格中,与取代掺杂相一致。光学测量表明带隙为1.44 eV。在380 nm、750 nm和850 nm处计算响应度(R)和检出率(D)。这些发现强调了铜掺杂SnS薄膜作为下一代柔性光电器件的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Plasmonics
Plasmonics 工程技术-材料科学:综合
CiteScore
5.90
自引率
6.70%
发文量
164
审稿时长
2.1 months
期刊介绍: Plasmonics is an international forum for the publication of peer-reviewed leading-edge original articles that both advance and report our knowledge base and practice of the interactions of free-metal electrons, Plasmons. Topics covered include notable advances in the theory, Physics, and applications of surface plasmons in metals, to the rapidly emerging areas of nanotechnology, biophotonics, sensing, biochemistry and medicine. Topics, including the theory, synthesis and optical properties of noble metal nanostructures, patterned surfaces or materials, continuous or grated surfaces, devices, or wires for their multifarious applications are particularly welcome. Typical applications might include but are not limited to, surface enhanced spectroscopic properties, such as Raman scattering or fluorescence, as well developments in techniques such as surface plasmon resonance and near-field scanning optical microscopy.
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