{"title":"Broadband two-dimensional far-field beam profiling of commercial CW terahertz photomixers from 0.2 to 1.5 THz","authors":"Mathias Hedegaard Kristensen, Esben Skovsen","doi":"10.1016/j.infrared.2025.106094","DOIUrl":null,"url":null,"abstract":"<div><div>We present a systematic far-field characterization of four commercial PIN diode terahertz photomixers over the 0.2–1.5<!--> <!-->THz frequency range using a two-dimensional (2D) raster scanning method. The emission pattern of each transmitter, equipped with an integrated hyper-hemispherical silicon lens, was characterized using a broadband Schottky diode receiver over a 35 × 35<!--> <!-->mm<span><math><msup><mrow></mrow><mrow><mn>2</mn></mrow></msup></math></span> grid. The results reveal consistent frequency-dependent beam divergence and the emergence of distinct Airy diffraction patterns at intermediate frequencies, attributed to lens-induced aperture effects. In addition to qualitative mapping, we extract quantitative metrics – including divergence slope, beam asymmetry, ellipticity, and centroid variability – that enable objective comparison of beam profiles across devices and frequencies. This comprehensive mapping underscores the importance of full 2D beam profiling for understanding THz propagation and offers insights into lens design and photomixer packaging for optimized system performance.</div></div>","PeriodicalId":13549,"journal":{"name":"Infrared Physics & Technology","volume":"151 ","pages":"Article 106094"},"PeriodicalIF":3.4000,"publicationDate":"2025-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared Physics & Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1350449525003871","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
We present a systematic far-field characterization of four commercial PIN diode terahertz photomixers over the 0.2–1.5 THz frequency range using a two-dimensional (2D) raster scanning method. The emission pattern of each transmitter, equipped with an integrated hyper-hemispherical silicon lens, was characterized using a broadband Schottky diode receiver over a 35 × 35 mm grid. The results reveal consistent frequency-dependent beam divergence and the emergence of distinct Airy diffraction patterns at intermediate frequencies, attributed to lens-induced aperture effects. In addition to qualitative mapping, we extract quantitative metrics – including divergence slope, beam asymmetry, ellipticity, and centroid variability – that enable objective comparison of beam profiles across devices and frequencies. This comprehensive mapping underscores the importance of full 2D beam profiling for understanding THz propagation and offers insights into lens design and photomixer packaging for optimized system performance.
期刊介绍:
The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region.
Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine.
Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.