{"title":"Growth, static and dynamic magnetic properties of cobalt thin films","authors":"Ahmed Kharmouche","doi":"10.1007/s10854-025-15551-y","DOIUrl":null,"url":null,"abstract":"<div><p>A series of Co thin films with various thicknesses ranging from 50 to 400 nm has been fabricated using thermal heating under vacuum. The impact of the magnetic layer thickness on the magnetocrystalline anisotropy of the films is studied. The alternating gradient field magnetometer, and the atomic force microscopy, as well as the Brillouin light scattering tools have been used to carry out the static and the dynamic properties of these films. The films are principally c-axis oriented. MFM observations exhibit stripe domain patterns. The magnetization easy axis was found to lie in the film plane, the measured spontaneous magnetization being 1410 emu/cm<sup>3</sup>. We measured and computed the effective magnetocrystalline factors. Enhanced constant anisotropy values are found. Values of <i>K</i><sub><i>u</i></sub> up to 8.40 × 10<sup>6</sup> erg/cm<sup>3</sup> have been measured. These values have been found to decrease with the increase of the thickness layer.</p></div>","PeriodicalId":646,"journal":{"name":"Journal of Materials Science: Materials in Electronics","volume":"36 24","pages":""},"PeriodicalIF":2.8000,"publicationDate":"2025-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Materials Science: Materials in Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10854-025-15551-y","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A series of Co thin films with various thicknesses ranging from 50 to 400 nm has been fabricated using thermal heating under vacuum. The impact of the magnetic layer thickness on the magnetocrystalline anisotropy of the films is studied. The alternating gradient field magnetometer, and the atomic force microscopy, as well as the Brillouin light scattering tools have been used to carry out the static and the dynamic properties of these films. The films are principally c-axis oriented. MFM observations exhibit stripe domain patterns. The magnetization easy axis was found to lie in the film plane, the measured spontaneous magnetization being 1410 emu/cm3. We measured and computed the effective magnetocrystalline factors. Enhanced constant anisotropy values are found. Values of Ku up to 8.40 × 106 erg/cm3 have been measured. These values have been found to decrease with the increase of the thickness layer.
期刊介绍：
The Journal of Materials Science: Materials in Electronics is an established refereed companion to the Journal of Materials Science. It publishes papers on materials and their applications in modern electronics, covering the ground between fundamental science, such as semiconductor physics, and work concerned specifically with applications. It explores the growth and preparation of new materials, as well as their processing, fabrication, bonding and encapsulation, together with the reliability, failure analysis, quality assurance and characterization related to the whole range of applications in electronics. The Journal presents papers in newly developing fields such as low dimensional structures and devices, optoelectronics including III-V compounds, glasses and linear/non-linear crystal materials and lasers, high Tc superconductors, conducting polymers, thick film materials and new contact technologies, as well as the established electronics device and circuit materials.
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