{"title":"Hardware Trojan Design With Low Overhead and High Destructiveness for STT-MRAM-Based CIMs","authors":"Wei-Che Cheng;Shih-Hsu Huang;Jin-Fu Li","doi":"10.1109/TCAD.2025.3541483","DOIUrl":null,"url":null,"abstract":"To overcome the von Neumann bottleneck, computing-in-memories (CIMs) have emerged as a design trend. On the other hand, with the globalization of the semiconductor supply chain, hardware Trojans have become a significant security concern. While there have been some studies on hardware Trojan designs for embedded memories in the past, there is no literature addressing hardware Trojan designs for CIMs. In this article, we propose a hardware Trojan design for spin transfer torque magnetoresistive random access memory (STT-MRAM)-based CIMs that can disrupt computing-mode operations. Our trigger circuit can evade detection during post-manufacturing memory testing, and our payload circuit can disrupt over 99% of CIM operations. Experimental results also demonstrate that compared to the original peripheral circuits of STT-MRAM-based CIMs, the area overhead and power overhead (at the TT process corner) caused by our inserted hardware Trojan are only 1.023% and 0.123%, respectively. Therefore, our hardware Trojan can easily hide within the peripheral circuits.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"44 9","pages":"3260-3273"},"PeriodicalIF":2.9000,"publicationDate":"2025-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10883655/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
To overcome the von Neumann bottleneck, computing-in-memories (CIMs) have emerged as a design trend. On the other hand, with the globalization of the semiconductor supply chain, hardware Trojans have become a significant security concern. While there have been some studies on hardware Trojan designs for embedded memories in the past, there is no literature addressing hardware Trojan designs for CIMs. In this article, we propose a hardware Trojan design for spin transfer torque magnetoresistive random access memory (STT-MRAM)-based CIMs that can disrupt computing-mode operations. Our trigger circuit can evade detection during post-manufacturing memory testing, and our payload circuit can disrupt over 99% of CIM operations. Experimental results also demonstrate that compared to the original peripheral circuits of STT-MRAM-based CIMs, the area overhead and power overhead (at the TT process corner) caused by our inserted hardware Trojan are only 1.023% and 0.123%, respectively. Therefore, our hardware Trojan can easily hide within the peripheral circuits.
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.