The IEEE Tianjin AP/MTT/SSC Joint Chapter: Promoting Innovation and Excellence in Microelectronics Through Academic Exchange and Collaboration [Chapters]
{"title":"The IEEE Tianjin AP/MTT/SSC Joint Chapter: Promoting Innovation and Excellence in Microelectronics Through Academic Exchange and Collaboration [Chapters]","authors":"Yu Luo;Keping Wang;Yongqiang Wang;Ningning Yan;Feng Feng;Fanyi Meng;Chao Zhang","doi":"10.1109/MSSC.2025.3583520","DOIUrl":null,"url":null,"abstract":"Provides society information that may include news, reviews or technical notes that should be of interest to practitioners and researchers.","PeriodicalId":100636,"journal":{"name":"IEEE Solid-State Circuits Magazine","volume":"17 3","pages":"97-97"},"PeriodicalIF":0.0000,"publicationDate":"2025-08-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11131416","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Solid-State Circuits Magazine","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/11131416/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract
Provides society information that may include news, reviews or technical notes that should be of interest to practitioners and researchers.