Monitoring nanoparticle self-assembly on liquid subphases in situ in a vertical scattering geometry

Felix Lehmkühler , Fabian Westermeier , Juan J. Barrios-Capuchino , Daniel Weschke , Francesco Dallari , Wojciech Roseker , Wolfgang J. Parak , Florian Schulz
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Abstract

Nanoparticle (NP) self-assembly is a promising tool for the straightforward preparation of complex materials without lithography. Self-assembly on liquid subphases is established for the preparation of thin NP films with quasicrystalline order on large scales. Small-angle X-ray scattering (SAXS) at synchrotron radiation sources is in particular advantageous to study self-assembly in situ, providing detailed structural information with high temporal resolution. Here we present a new experimental setup that allows measuring SAXS in a vertical geometry. This way it is possible to study the self-assembly of nanoparticles on liquid subphases in situ as demonstrated with gold nanoparticles. In contrast to measurements with grazing incidence (GISAXS), spatial resolution in the µm range and sampling of the volume material is possible. Integration of optical microscopy allows observing the measurement position and formation of supercrystal flakes. The setup can be used to study self-assembly of various nanoparticles on liquid subphases but is not limited to such studies. It was realized at the beamline P10 at PETRA III (Deutsches Elektronen-Synchrotron DESY, Hamburg, Germany).

Abstract Image

在垂直散射几何中监测纳米颗粒在液相上的自组装
纳米粒子(NP)自组装是一种很有前途的工具,可以直接制备复杂的材料,而无需光刻。在液相亚相上建立了大规模制备准晶有序NP薄膜的自组装机制。同步辐射源下的小角度x射线散射(SAXS)对原位自组装研究尤其有利,可以提供高时间分辨率的详细结构信息。在这里,我们提出了一个新的实验装置,允许在垂直几何测量SAXS。这样就可以研究纳米颗粒在液相上的自组装,正如金纳米颗粒所展示的那样。与掠入射测量(GISAXS)相比,微米范围内的空间分辨率和体积材料的采样是可能的。集成光学显微镜允许观察测量位置和形成的超晶片。该装置可用于研究各种纳米颗粒在液相上的自组装,但不限于此类研究。它是在PETRA III(德国汉堡的德国电子同步加速器DESY)的光束线P10上实现的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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