In situ TEM and EELS analysis of Ni catalytic nanoparticles for dry reforming of methane

IF 2.2 3区 工程技术 Q1 MICROSCOPY
Yutain Han , Xiaobo Peng , Hideki Abe , Ayako Hashimoto
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引用次数: 0

Abstract

Dry reforming of methane (DRM, CH4+CO2→2CO+2H2) involves production of CO and H2 using two kinds of greenhouse gases, CH4 and CO2, without requiring an expensive and complicated gas separation process. Using a developed specimen holder, we observed the Ni nanoparticles on Al2O3 supports during DRM catalysis through in situ transmission electron microscopy and electron energy loss spectroscopy by tracking each individual nanoparticle to elucidate the structural and chemical features of the working catalyst under practical conditions. The average value of the Ni L3/L2 intensity ratio, which relates to the valence state (i.e., oxidation state), shows that the Ni nanoparticles were oxidized at 450 °C in the DRM gas and then slightly reduced at 650 °C as a whole. But the Ni nanoparticles actually exhibited a range of oxidation states under DRM conditions. In particular, some oxidized Ni nanoparticles were reduced at 550 °C and drastically changed in size, becoming much smaller. Compared with in situ observations under only CH4 gas, without CO2, oxidation of the Ni surface was directly and locally observed, presumably due to the reaction with Al2O3 and the decomposition of CO2. Additionally, the reduction of oxidized Ni was mainly due to hydrogen-containing gases. Furthermore, carbon deposition was observed at 350 °C, containing both amorphous carbon and graphene layers.
Ni纳米颗粒催化甲烷干重整的原位TEM和EELS分析
甲烷干重整(DRM, CH4+CO2→2CO+2H2)涉及使用CH4和CO2两种温室气体生产CO和H2,不需要昂贵和复杂的气体分离过程。利用自制的样品架,通过原位透射电子显微镜和电子能量损失谱,观察了Al2O3载体上的Ni纳米颗粒在DRM催化过程中的表现,并对每个纳米颗粒进行了跟踪,以阐明实际条件下工作催化剂的结构和化学特征。与价态(即氧化态)相关的Ni L3/L2强度比平均值表明,Ni纳米颗粒在450℃时在DRM气体中被氧化,然后在650℃时整体略有还原。但在DRM条件下,Ni纳米颗粒实际上表现出一系列氧化态。特别是,一些氧化镍纳米颗粒在550°C时被还原,尺寸发生了急剧变化,变得小得多。与仅在CH4气体下的原位观察相比,在没有CO2的情况下,直接和局部观察到Ni表面的氧化,可能是由于与Al2O3的反应和CO2的分解。此外,氧化镍的还原主要是由含氢气体引起的。此外,在350°C下观察到碳沉积,其中包含非晶碳层和石墨烯层。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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