Data fusion of visible near-infrared and mid-infrared spectroscopy combined with feature selection and machine learning for rapid discrimination of fusarium head blight infection in wheat kernel and flour

IF 3.4 3区 物理与天体物理 Q2 INSTRUMENTS & INSTRUMENTATION
Muhammad Baraa Almoujahed, Rebecca L. Whetton, Abdul M. Mouazen
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引用次数: 0

Abstract

Fusarium head blight (FHB) is a significant crop fungal disease that downgrades the yield quality and affects food safety. There is a necessity for the development of fast and cost-effective detection approaches of FHB to meet the needs of the food industry, as the traditional methods are slow, costly, difficult, and expose chemicals to the environment. Visible near-infrared (vis-NIR) and mid-infrared (MIR) spectroscopy have been used as promising tools for the detection of FHB contamination and mycotoxins in cereal crops and foods. This study explores the potential of data fusion approaches of the vis-NIR (400–1650 nm) and MIR (4000 – 650 cm−1) spectra for FHB detection in wheat kernels and flour of eight varieties of wheat. Spectra concatenation and feature selection methods were utilized as input data for two different machine learning models, namely, random forest (RF), and decision tree (DT). For the selection of the most informative wavebands from both sensors, genetic algorithm (GA), recursive feature elimination (RFE), and principal component analysis (PCA), were employed. Results showed that spectral concatenation data fusion has resulted in very high test accuracy for FHB detection in both kernel and flour, with all models reaching 100% classification accuracy, except the RF-kernel model, which achieved 96.6%. Among the three feature selection algorithms, GA was the best method for the selection of the most informative bands related to FHB, resulting in a correct classification accuracy of 100 %, for both RF and DT modelling tools. For the RFE feature selection method, a lower classification accuracy of 96.6 % was obtained with both RF and DT models in kernels. However, PCA resulted in the lowest accuracies, dropping down by 10.3 % to 17.3 %, compared to that of GA and RFE, respectively. Overall, the proposed data fusion methods allow the non-destructive, rapid, and accurate detection of FHB infection in wheat flour and kernels. This is particularly useful for the flour as it is not possible to visually estimate the infected from healthy samples.
基于可见近红外和中红外光谱的数据融合结合特征选择和机器学习快速识别小麦籽粒和面粉赤霉病
赤霉病(Fusarium head blight, FHB)是一种严重影响作物产量质量和食品安全的真菌病害。由于传统的检测方法速度慢、成本高、难度大、化学物质易暴露于环境中,因此有必要开发快速、经济的FHB检测方法来满足食品工业的需求。可见近红外(vis-NIR)和中红外(MIR)光谱已被用作谷类作物和食品中FHB污染和真菌毒素检测的有前途的工具。本研究探讨了可见光-近红外光谱(400-1650 nm)和红外光谱(4000 - 650 cm−1)数据融合方法在小麦籽粒和面粉中FHB检测中的应用潜力。利用光谱拼接和特征选择方法作为两种不同机器学习模型的输入数据,即随机森林(RF)和决策树(DT)。为了从两个传感器中选择最具信息量的波段,采用了遗传算法(GA)、递归特征消除(RFE)和主成分分析(PCA)。结果表明,光谱级联数据融合对果仁和面粉中FHB的检测准确率都非常高,除RF-kernel模型达到96.6%外,其余模型的分类准确率均达到100%。在三种特征选择算法中,遗传算法是选择与FHB相关的信息最多的波段的最佳方法,RF和DT建模工具的正确分类准确率均为100%。对于RFE特征选择方法,在核中使用RF和DT模型均获得了较低的96.6%的分类准确率。然而,PCA的准确率最低,与GA和RFE相比分别下降了10.3%至17.3%。总的来说,所提出的数据融合方法可以无损、快速、准确地检测小麦粉和麦粒中的FHB感染。这对面粉特别有用,因为不可能从健康样品中直观地估计受感染的程度。
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来源期刊
CiteScore
5.70
自引率
12.10%
发文量
400
审稿时长
67 days
期刊介绍: The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region. Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine. Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.
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