A level shifting correlated multiple sampling circuit for low-noise CMOS image sensor

IF 1.9 3区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC
Ziwen Wang , Jing Gao
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引用次数: 0

Abstract

This paper presents a low noise level shifting correlated multiple sampling (LSCMS) circuit, which consists of PGA based on correlated level shifting (CLS) and improved CMS. The CLS technique is employed in PGA, which divides the holding state of PGA into evaluation and shifting state by a level-shifting capacitor. The output signal is first stored by the shifting capacitor during the evaluation phase, and is removed from the amplifier's output during the shifting phase, which makes the equivalent input voltage approach the ideal virtual ground. Thus, the error from finite opamp gain is reduced and signal accuracy is improved. In improved CMS, the reset signal and exposure signal of pixel are differentially processed through capacitor flipping, which reduces the readout time and the number of capacitors by 12.5 %. Furthermore, the high accuracy buffer is employed in the CMS, which decreases noise and improves signal accuracy. The simulation results show that the LSCMS circuit achieves an input-referred random noise of 64.8μVrms.
一种用于低噪声CMOS图像传感器的电平移位相关多重采样电路
提出了一种低噪声移电平相关多采样(LSCMS)电路,该电路由基于相关移电平的PGA和改进的CMS组成。将CLS技术应用于PGA中,通过移电平电容将PGA的保持状态分为评估状态和移电平状态。输出信号在评估阶段先由移位电容存储,在移相阶段从放大器输出端移出,使等效输入电压接近理想虚地。从而减小了有限运放增益带来的误差,提高了信号精度。在改进的CMS中,通过电容翻转对像素的复位信号和曝光信号进行差分处理,使读出时间和电容器数量减少12.5%。此外,该系统采用高精度缓冲器,降低了噪声,提高了信号精度。仿真结果表明,LSCMS电路的输入参考随机噪声为64.8μVrms。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Microelectronics Journal
Microelectronics Journal 工程技术-工程:电子与电气
CiteScore
4.00
自引率
27.30%
发文量
222
审稿时长
43 days
期刊介绍: Published since 1969, the Microelectronics Journal is an international forum for the dissemination of research and applications of microelectronic systems, circuits, and emerging technologies. Papers published in the Microelectronics Journal have undergone peer review to ensure originality, relevance, and timeliness. The journal thus provides a worldwide, regular, and comprehensive update on microelectronic circuits and systems. The Microelectronics Journal invites papers describing significant research and applications in all of the areas listed below. Comprehensive review/survey papers covering recent developments will also be considered. The Microelectronics Journal covers circuits and systems. This topic includes but is not limited to: Analog, digital, mixed, and RF circuits and related design methodologies; Logic, architectural, and system level synthesis; Testing, design for testability, built-in self-test; Area, power, and thermal analysis and design; Mixed-domain simulation and design; Embedded systems; Non-von Neumann computing and related technologies and circuits; Design and test of high complexity systems integration; SoC, NoC, SIP, and NIP design and test; 3-D integration design and analysis; Emerging device technologies and circuits, such as FinFETs, SETs, spintronics, SFQ, MTJ, etc. Application aspects such as signal and image processing including circuits for cryptography, sensors, and actuators including sensor networks, reliability and quality issues, and economic models are also welcome.
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