Yi Lian, Yongqi Liu, Dewen Cheng, Cheng Chi, Yanjun Bao, Yongtian Wang
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引用次数: 0
Abstract
Transport-of-intensity equation (TIE) as a noninterference method for quantitative phase imaging (QPI) has broad applications in micrographic imaging and optical metrology. Previous TIE-based QPI systems require the axial displacement of the detector to capture the axial intensity distributions, thus limiting the systems’ response speed, integration, and phase retrieval accuracy. Besides, the TIE-based phase imaging for edge positions with large phase gradients remains challenging. In this work, a compact polarization-multiplexed Moiré metalens is proposed to achieve QPI and edge-enhanced imaging for high-precision and unwrapping phase imaging. This Moiré metalens enables continuous zooming from 58.7 μm to 61.8 μm, allowing flexible selection of the detection positions. Under x-polarization light incidence, the metalens can achieve phase retrieval based on the TIE method, with the Root Mean Square Errors (RMSE) reaching 0.015 rad. Under y-polarization light incidence, the metalens realizes varifocal edge-enhanced imaging for amplitude and phase objects, with a minimum spatial resolution of 1.3 μm. This Moiré metalens opens a new avenue to develop compact, integrated, and multifunctional phase imaging devices and has potential applications in optical detection, microscopy, and biomedical imaging.
期刊介绍:
Nanophotonics, published in collaboration with Sciencewise, is a prestigious journal that showcases recent international research results, notable advancements in the field, and innovative applications. It is regarded as one of the leading publications in the realm of nanophotonics and encompasses a range of article types including research articles, selectively invited reviews, letters, and perspectives.
The journal specifically delves into the study of photon interaction with nano-structures, such as carbon nano-tubes, nano metal particles, nano crystals, semiconductor nano dots, photonic crystals, tissue, and DNA. It offers comprehensive coverage of the most up-to-date discoveries, making it an essential resource for physicists, engineers, and material scientists.