An adaptive sampling method based on simplified mesh with multi-constraint for free-form surface measurement

IF 3.7 2区 工程技术 Q2 ENGINEERING, MANUFACTURING
Ma Zhifu , Lu Yong , Ma Shoudong , Deng Kenan
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引用次数: 0

Abstract

In terms of contact-based measurement, the sampling points distribution affects measurement efficiency and accuracy significantly. In this study, an adaptive sampling method based on simplified mesh with multi-constraint for free-form surface measurement is proposed. Firstly, the edge contraction strategy is used for mesh simplification. To improve the contraction efficiency, contraction target vertices are mapped to existing vertices. Subsequently, the mesh simplification procedure is established. To avoid mesh degradation during simplification, mesh edge types are defined. The construction of vertex pairs used for edge contraction is investigated. In simplification cost calculation, an area preservation factor is introduced to improve the simplification result, and the multi-constraint-based simplification cost calculation procedure is developed. Sampling points are then distributed according to the simplified mesh. Finally, simulations and experiments are conducted to validate the effectiveness of the proposed sampling method.
一种基于多约束简化网格的自适应自由曲面测量方法
在接触式测量中,采样点的分布对测量效率和精度影响很大。提出了一种基于多约束简化网格的自适应采样方法,用于自由曲面的测量。首先,采用边缘收缩策略进行网格化简。为了提高收缩效率,收缩目标顶点被映射到已有顶点。随后,建立了网格化简程序。为了避免在简化过程中网格退化,定义了网格边缘类型。研究了用于边收缩的顶点对的构造。在简化成本计算中,引入面积保留因子来改善简化结果,开发了基于多约束的简化成本计算程序。然后根据简化网格分布采样点。最后,通过仿真和实验验证了所提采样方法的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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