Analytical solution of the classical Rayleigh length definition, including truncation at arbitrary values

IF 1.9 4区 工程技术 Q3 MICROSCOPY
Aufried Lenferink, Cees Otto
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引用次数: 0

Abstract

We present the analytical solution to the diffraction integral that describes the Rayleigh length for a focused Gaussian beam with any value of a spherical truncating aperture. This exact solution is in precise agreement with numerical calculations for the light distribution in the near focal area. The solution arises under assumption of the paraxial approximation, which also provides the basis for the classical Rayleigh length definition. It will be shown that the non-paraxial regime can be included by adding an empirical term (Cnp) to the solution of the diffraction integral. This extends the validity of the expression to high numerical apertures (NA) up to n times 0.95, with n being the refractive index of the immersion medium. Thus, the entire practical range of NA, encountered in optical microscopy, is covered with a calculated error of less than 0.4% in the non-paraxial limit. This theoretical result is important in the design of optical instrumentation, where overall light efficiency in excitation and detection and spatial resolution must be optimised together.

Abstract Image

经典瑞利长度定义的解析解,包括在任意值处的截断。
本文给出了描述具有任意球面截断孔径值的聚焦高斯光束的瑞利长度的衍射积分的解析解。该精确解与近焦区光分布的数值计算结果完全一致。该解是在傍轴近似的假设下得到的,为经典的瑞利长度定义提供了基础。通过在衍射积分的解中加入经验项(Cnp),将证明非傍轴区可以包括在内。这将表达式的有效性扩展到高数值孔径(NA)高达n乘以0.95,其中n为浸没介质的折射率。因此,在光学显微镜中遇到的NA的整个实际范围,在非近轴极限下的计算误差小于0.4%。这一理论结果在光学仪器的设计中是重要的,在光学仪器中,激发和探测的整体光效和空间分辨率必须一起优化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of microscopy
Journal of microscopy 工程技术-显微镜技术
CiteScore
4.30
自引率
5.00%
发文量
83
审稿时长
1 months
期刊介绍: The Journal of Microscopy is the oldest journal dedicated to the science of microscopy and the only peer-reviewed publication of the Royal Microscopical Society. It publishes papers that report on the very latest developments in microscopy such as advances in microscopy techniques or novel areas of application. The Journal does not seek to publish routine applications of microscopy or specimen preparation even though the submission may otherwise have a high scientific merit. The scope covers research in the physical and biological sciences and covers imaging methods using light, electrons, X-rays and other radiations as well as atomic force and near field techniques. Interdisciplinary research is welcome. Papers pertaining to microscopy are also welcomed on optical theory, spectroscopy, novel specimen preparation and manipulation methods and image recording, processing and analysis including dynamic analysis of living specimens. Publication types include full papers, hot topic fast tracked communications and review articles. Authors considering submitting a review article should contact the editorial office first.
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