{"title":"Inspection of edge detection using spatial frequency filtering","authors":"Jingwei Wang , Tatsuki Otsubo , Megumu Kuroiwa , Toshiaki Yasaka , Soichirou Kanemaru , Takanori Yazawa","doi":"10.1016/j.precisioneng.2025.07.016","DOIUrl":null,"url":null,"abstract":"<div><div>This study proposes a defect detection system based on spatial frequency filtering to measure edge chipping in two types of tools: straight-edged punching blades and closed-curve punching dies, both made of ultrafine grain cemented carbide. Although different optical configurations were applied to accommodate the geometry of each tool, both systems are based on the same measurement principle using high-pass spatial frequency filtering, and they share a unified image processing algorithm for quantifying edge chipping and suppressing the influence of dust and other noise. A spatial filter is placed at the back focal plane of the Fourier transform lens to block the 0-order ray, forming a clear light-dark-light fringe pattern. Combined with the proposed image processing algorithm, this enables accurate extraction of edge positions and robust evaluation of micro-scale defects. Experiments demonstrated that the developed system could detect edge chipping larger than 1 μm in both types of tools. This research presents a practical and adaptable solution for non-contact defect detection and contributes to advanced quality assurance in industrial blade manufacturing.</div></div>","PeriodicalId":54589,"journal":{"name":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","volume":"96 ","pages":"Pages 721-728"},"PeriodicalIF":3.7000,"publicationDate":"2025-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141635925002260","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0
Abstract
This study proposes a defect detection system based on spatial frequency filtering to measure edge chipping in two types of tools: straight-edged punching blades and closed-curve punching dies, both made of ultrafine grain cemented carbide. Although different optical configurations were applied to accommodate the geometry of each tool, both systems are based on the same measurement principle using high-pass spatial frequency filtering, and they share a unified image processing algorithm for quantifying edge chipping and suppressing the influence of dust and other noise. A spatial filter is placed at the back focal plane of the Fourier transform lens to block the 0-order ray, forming a clear light-dark-light fringe pattern. Combined with the proposed image processing algorithm, this enables accurate extraction of edge positions and robust evaluation of micro-scale defects. Experiments demonstrated that the developed system could detect edge chipping larger than 1 μm in both types of tools. This research presents a practical and adaptable solution for non-contact defect detection and contributes to advanced quality assurance in industrial blade manufacturing.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.