{"title":"Backside Active Power Delivery With Hybrid DC–DC Converter Enabled by Amorphous Oxide Semiconductor Transistors","authors":"Jungyoun Kwak;Sunbin Deng;Junmo Lee;Suman Datta;Shimeng Yu","doi":"10.1109/TVLSI.2025.3570078","DOIUrl":null,"url":null,"abstract":"The increasing demand for energy-efficient computing has created the need for advanced power management solutions. Backside power delivery network (BSPDN) has been introduced in the industry for 2-nm node with passive wires. In this work, we propose adding active components (power transistors) to the backside of silicon in a back-end-of-line (BEOL)-compatible fabrication process. The goal is to enable 12–0.7-V voltage downconversion at the backside of silicon (near the point of load, i.e., the frontside logic compute die) to minimize the IR drop and improve overall system-level conversion efficiency. This work leverages a hybrid monolithic 3-D (M3D)dc-dc converter architecture combining switched-capacitor (SC) and synchronous buck converter topologies with BEOL-compatible active and passive devices. The design employs amorphous tungsten-doped indium oxide (IWO) transistors, which offer high breakdown voltage and tunable threshold voltages, supporting both enhancement and depletion modes for efficient switching. With the experimentally calibrated compact models, the simulated hybrid converter design achieves 12–0.7-V conversion with a peak efficiency of 95.6% at a power density of 330 mW/mm<sup>2</sup>, demonstrating the feasibility of M3D SC dc-dc converters for next-generation power management in high-performance edge devices.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 8","pages":"2153-2162"},"PeriodicalIF":3.1000,"publicationDate":"2025-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11016917/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
The increasing demand for energy-efficient computing has created the need for advanced power management solutions. Backside power delivery network (BSPDN) has been introduced in the industry for 2-nm node with passive wires. In this work, we propose adding active components (power transistors) to the backside of silicon in a back-end-of-line (BEOL)-compatible fabrication process. The goal is to enable 12–0.7-V voltage downconversion at the backside of silicon (near the point of load, i.e., the frontside logic compute die) to minimize the IR drop and improve overall system-level conversion efficiency. This work leverages a hybrid monolithic 3-D (M3D)dc-dc converter architecture combining switched-capacitor (SC) and synchronous buck converter topologies with BEOL-compatible active and passive devices. The design employs amorphous tungsten-doped indium oxide (IWO) transistors, which offer high breakdown voltage and tunable threshold voltages, supporting both enhancement and depletion modes for efficient switching. With the experimentally calibrated compact models, the simulated hybrid converter design achieves 12–0.7-V conversion with a peak efficiency of 95.6% at a power density of 330 mW/mm2, demonstrating the feasibility of M3D SC dc-dc converters for next-generation power management in high-performance edge devices.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.