Kris Vanstreels, Oguzhan Orkut Okudur, Mario Gonzalez, Eric Beyne
{"title":"Quantitative assessment of adhesion strength in hybrid bonded interfaces with varying metal contact density","authors":"Kris Vanstreels, Oguzhan Orkut Okudur, Mario Gonzalez, Eric Beyne","doi":"10.1016/j.mee.2025.112384","DOIUrl":null,"url":null,"abstract":"<div><div>This work systematically investigates the influence of metal contact density and pitch size on the adhesion strength of hybrid bonded interfaces using an energy-based nanoindentation methodology to quantify interfacial bond strength. Results show that the presence of metal at the bonding interface enhances adhesion strength of hybrid bonded interfaces, with the effect becoming increasingly pronounced for lower pitch sizes. This enhancement is attributed to the role of metal/metal interfaces as crack-arresting sites during interfacial fracture. The findings in this work provide critical insights for optimizing hybrid bonding designs in advanced interconnect technologies.</div></div>","PeriodicalId":18557,"journal":{"name":"Microelectronic Engineering","volume":"300 ","pages":"Article 112384"},"PeriodicalIF":3.1000,"publicationDate":"2025-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectronic Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0167931725000735","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
This work systematically investigates the influence of metal contact density and pitch size on the adhesion strength of hybrid bonded interfaces using an energy-based nanoindentation methodology to quantify interfacial bond strength. Results show that the presence of metal at the bonding interface enhances adhesion strength of hybrid bonded interfaces, with the effect becoming increasingly pronounced for lower pitch sizes. This enhancement is attributed to the role of metal/metal interfaces as crack-arresting sites during interfacial fracture. The findings in this work provide critical insights for optimizing hybrid bonding designs in advanced interconnect technologies.
期刊介绍:
Microelectronic Engineering is the premier nanoprocessing, and nanotechnology journal focusing on fabrication of electronic, photonic, bioelectronic, electromechanic and fluidic devices and systems, and their applications in the broad areas of electronics, photonics, energy, life sciences, and environment. It covers also the expanding interdisciplinary field of "more than Moore" and "beyond Moore" integrated nanoelectronics / photonics and micro-/nano-/bio-systems. Through its unique mixture of peer-reviewed articles, reviews, accelerated publications, short and Technical notes, and the latest research news on key developments, Microelectronic Engineering provides comprehensive coverage of this exciting, interdisciplinary and dynamic new field for researchers in academia and professionals in industry.