James G McNally, Christoph Pratsch, Stephan Werner, Stefan Rehbein, Andrew Gibbs, Jihao Wang, Thomas Lunkenbein, Peter Guttmann, Gerd Schneider
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引用次数: 0
Abstract
Transmission X-ray microscopes (TXMs) are now increasingly used for quantitative analysis of samples, most notably in the spectral analysis of materials. Validating such measurements requires quantitatively accurate models for these microscopes, but current TXM models have only been tested qualitatively. Here we develop an experimental and theoretical framework for evaluation of TXMs that uses Mie theory to compute the electric field emerging from a nanosphere. We approximate the microscope's condenser illumination by plane waves at the mean illumination angle and the zone plate by a thin lens. We find that this model produces good qualitative agreement with our 3D measurements of 60 nm gold nanospheres, but only if both β and δ for the complex refractive index n = 1 - δ + iβ of gold are included in the model. This shows that both absorption and phase properties of the specimen influence the acquired TXM image. The qualitative agreement improves if we incorporate a small tilt into the condenser illumination relative to the optical axis, implying a small misalignment in the microscope. Finally, in quantitative comparisons, we show that the model predicts the nanosphere's expected absorption as determined by Beer's law, whereas the microscope underestimates this absorption by 10-20%. This surprising observation highlights the need for future work to identify the microscope feature(s) that lead to this quantitative discrepancy.
期刊介绍:
The Beilstein Journal of Nanotechnology is an international, peer-reviewed, Open Access journal. It provides a unique platform for rapid publication without any charges (free for author and reader) – Platinum Open Access. The content is freely accessible 365 days a year to any user worldwide. Articles are available online immediately upon publication and are publicly archived in all major repositories. In addition, it provides a platform for publishing thematic issues (theme-based collections of articles) on topical issues in nanoscience and nanotechnology.
The journal is published and completely funded by the Beilstein-Institut, a non-profit foundation located in Frankfurt am Main, Germany. The editor-in-chief is Professor Thomas Schimmel – Karlsruhe Institute of Technology. He is supported by more than 20 associate editors who are responsible for a particular subject area within the scope of the journal.