High-quality epitaxial BaTiO3 films grown by high-vacuum chemical vapor deposition for integrated electro-optical devices

IF 2.9 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY
Wojciech Szmyt , Jacqueline Geler-Kremer , Christof Vockenhuber , Arnold Müller , Timo Schumann , Patrik Hoffmann
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Abstract

Synthesizing high-quality epitaxial BaTiO3 (BTO) by means of high-vacuum chemical vapor deposition (HV-CVD) requires a precise control over precursor fluxes impinging onto the heated substrate surface so that the incorporation rates of all elements correspond to the BTO film stoichiometry. Moreover, overall precursor flux magnitude strongly influences the morphology of the film grown at a given substrate temperature. HV-CVD in a combinatorial mode allows to explore a wide range of fluxes over the substrate surface in a single synthesis, saving a lot of time on process optimization. Owing to the high vacuum during synthesis, the precursor trajectories are ballistic, thus the fluxes at the location on the substrate of the best film quality are analytically evaluated. The optimized conditions are transferred into a uniform deposition mode on SrTiO3-buffered substrate for epitaxial compatibility and further fine-tuned for the improved film quality. The obtained films are characterized by SEM, EDX, XRD, AFM, ellipsometry and RBS/HI-ERDA elemental analysis. The characterization confirms that the films are stoichiometric and pure, highly oriented (XRD rocking curve FHWM <1°), near-atomically smooth, and of minimal porosity (∼1–3 % void content). The results indicate that BTO films of excellent quality are achievable using this highly scalable and competitively cost-effective technique.

Abstract Image

高真空化学气相沉积制备高品质集成光电器件外延BaTiO3薄膜
采用高真空化学气相沉积(HV-CVD)方法合成高质量的外延BaTiO3 (BTO)需要精确控制冲击到加热衬底表面的前驱体通量,以使所有元素的掺杂率符合BTO薄膜的化学计量。此外,整体前驱体通量大小强烈影响在给定衬底温度下生长的薄膜的形态。组合模式下的HV-CVD可以在单次合成中探索衬底表面上的大范围通量,从而节省了大量工艺优化时间。由于合成过程中的高真空,前驱体轨迹呈弹道轨迹,因此可以对基片上膜质量最佳位置的通量进行分析计算。为了提高外延兼容性,将优化后的条件转移到srtio3缓冲衬底上的均匀沉积模式,并进一步微调以提高薄膜质量。采用SEM、EDX、XRD、AFM、椭偏仪和RBS/HI-ERDA元素分析对膜进行了表征。表征证实,该薄膜具有化学计量学性质和纯度,高取向(XRD摇摆曲线FHWM <;1°),接近原子光滑,孔隙率最小(空隙含量约1 - 3%)。结果表明,采用这种高可扩展性和具有竞争力的成本效益的技术可以获得高质量的BTO薄膜。
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来源期刊
Materialia
Materialia MATERIALS SCIENCE, MULTIDISCIPLINARY-
CiteScore
6.40
自引率
2.90%
发文量
345
审稿时长
36 days
期刊介绍: Materialia is a multidisciplinary journal of materials science and engineering that publishes original peer-reviewed research articles. Articles in Materialia advance the understanding of the relationship between processing, structure, property, and function of materials. Materialia publishes full-length research articles, review articles, and letters (short communications). In addition to receiving direct submissions, Materialia also accepts transfers from Acta Materialia, Inc. partner journals. Materialia offers authors the choice to publish on an open access model (with author fee), or on a subscription model (with no author fee).
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