Chee-An Yu;Yu-Tung Liu;Yu-Hao Cheng;Shao-Yu Wu;Hung-Ming Chen;C.-C. Jay Kuo
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引用次数: 0
Abstract
An energy-efficient high-performance static IR-drop estimation method based on green learning called Green IR Drop (GIRD) is proposed in this work. GIRD processes the IC design input in three steps. First, the input netlist data are converted to multichannel maps. Their joint spatial–spectral representations are determined with PixelHop. Next, discriminant features are selected using the relevant feature test (RFT). Finally, the selected features are fed to the eXtreme Gradient Boosting trees regressor. Both PixelHop and RFT are green learning tools. GIRD yields a low carbon footprint due to its smaller model sizes and lower computational complexity. Besides, its performance scales well with small training datasets. Experiments on synthetic and real circuits are given to demonstrate the superior performance of GIRD. The model size and the complexity, measured by the floating point operations (FLOPs) of GIRD, are only $10^{-3}$ and $10^{-2}$ of deep-learning methods, respectively.
本文提出了一种基于绿色学习的高效节能的静态IR下降估计方法——green IR Drop (GIRD)。grid分三步处理IC设计输入。首先,将输入的网表数据转换为多通道映射。它们的联合空间-光谱表示是由PixelHop确定的。其次,使用相关特征测试(RFT)选择判别特征。最后,选择的特征被馈送到极端梯度增强树回归器。PixelHop和RFT都是绿色学习工具。由于其较小的模型尺寸和较低的计算复杂性,GIRD产生低碳足迹。此外,它的性能在小的训练数据集上也能很好地扩展。在合成电路和实际电路上进行了实验,证明了grid的优越性能。以GIRD的浮点运算(FLOPs)衡量的模型大小和复杂性分别只有深度学习方法的$10^{-3}$和$10^{-2}$。
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.