Yu-Tso Liao , Cheng-Hui Li , Jyun-Han Chen , Wei-Lun Wei , Shi-Yu Liu , Hsiang-Lin Liu , Bi-Hsuan Lin , Ming-Yau Chern , Fang-Yuh Lo
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引用次数: 0
Abstract
Samarium doped zinc oxide (Sm:ZnO) thin films were fabricated on c-oriented sapphire substrates by pulsed-laser deposition with Sm dopant from 0 to 10 at.%. X-ray diffraction patterns, X-ray fluorescence mapping, and X-ray absorption near-edge structure spectra indicated uniform incorporation of Sm into ZnO lattice without secondary phase. With increasing Sm concentration, zinc vacancy or oxygen interstitial is formed to maintain electrical neutrality, which are identified by photoluminescence spectroscopy. The increasing defect concentration and decreasing exciton binding energy enhanced the photoresistance response in visible regime, where the absolute value of normalized resistance response was between 2 % and 8.79 % by 1 mW blue laser (wavelength of 450 nm) illumination for Sm:ZnO thin films. Time-dependent photoresistance measurements revealed two response times. The shorter response time, around 1.2–26.7 s, is contributed by the free electron-hole pair generation/recombination and the response of carriers trapped in deep level defects. The longer response time, around 76–858 s, is contributed by the captured oxygen on the thin film surface. Overall, the 5 at.% Sm:ZnO thin film is the best for photodetection applications due to its high photoresistance response and short response time.
期刊介绍:
Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials.
OPTICAL MATERIALS focuses on:
• Optical Properties of Material Systems;
• The Materials Aspects of Optical Phenomena;
• The Materials Aspects of Devices and Applications.
Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.