Single-walled carbon nanotube pristine films: Thickness determination, antireflective properties and two-photon 3D lithography demonstration

IF 4.2 3区材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY

Optical Materials Pub Date : 2025-07-15 DOI:10.1016/j.optmat.2025.117289

Denis M. Zhigunov , Margarita I. Sharipova , Yury G. Gladush , Dmitry V. Krasnikov , Vladimir O. Bessonov , Andrey A. Fedyanin , Albert G. Nasibulin

{"title":"Single-walled carbon nanotube pristine films: Thickness determination, antireflective properties and two-photon 3D lithography demonstration","authors":"Denis M. Zhigunov , Margarita I. Sharipova , Yury G. Gladush , Dmitry V. Krasnikov , Vladimir O. Bessonov , Andrey A. Fedyanin , Albert G. Nasibulin","doi":"10.1016/j.optmat.2025.117289","DOIUrl":null,"url":null,"abstract":"<div><div>We present a straightforward approach for measuring the thickness of highly porous and rough single-walled carbon nanotube (SWCNT) pristine thin films. Using the developed approach, the linear dependence of the film thickness on its absorbance at 550 nm was obtained with a slope coefficient of 404 nm, which can be used as a calibration curve for an optical determination of SWCNT pristine film thickness on the basis of spectrophotometry measurements. Transmittance and reflectance of free-standing SWCNT pristine films with thicknesses in the range of 20–120 nm are studied, and ultra-low specular reflectance below 0.05 % is obtained for the thinnest membrane. Perspectives of SWCNT-based antireflective coatings are explored using Si wafer as a reference. Finally, femtosecond laser 3D lithography is performed using free-standing SWCNT film as a substrate, which opens up new directions for the application of SWCNTs, for instance, in X-ray optics.</div></div>","PeriodicalId":19564,"journal":{"name":"Optical Materials","volume":"167 ","pages":"Article 117289"},"PeriodicalIF":4.2000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Materials","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0925346725006494","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}

引用次数: 0

Abstract

We present a straightforward approach for measuring the thickness of highly porous and rough single-walled carbon nanotube (SWCNT) pristine thin films. Using the developed approach, the linear dependence of the film thickness on its absorbance at 550 nm was obtained with a slope coefficient of 404 nm, which can be used as a calibration curve for an optical determination of SWCNT pristine film thickness on the basis of spectrophotometry measurements. Transmittance and reflectance of free-standing SWCNT pristine films with thicknesses in the range of 20–120 nm are studied, and ultra-low specular reflectance below 0.05 % is obtained for the thinnest membrane. Perspectives of SWCNT-based antireflective coatings are explored using Si wafer as a reference. Finally, femtosecond laser 3D lithography is performed using free-standing SWCNT film as a substrate, which opens up new directions for the application of SWCNTs, for instance, in X-ray optics.

查看原文本刊更多论文

单壁碳纳米管原始薄膜：厚度测定、抗反射特性和双光子3D光刻演示

我们提出了一种测量高多孔和粗糙单壁碳纳米管（SWCNT）原始薄膜厚度的直接方法。利用所建立的方法，获得了薄膜厚度与550 nm吸光度的线性关系，斜率系数为404 nm，可作为分光光度法测定swcnts原始薄膜厚度的校准曲线。研究了厚度为20 ~ 120nm的独立swcnts原始薄膜的透光率和反射率，最薄的薄膜的镜面反射率低于0.05%。以硅片为参考，探讨了基于单壁碳纳米管的减反射涂层的发展前景。最后，采用独立的SWCNTs薄膜作为衬底进行飞秒激光3D光刻，为SWCNTs在x射线光学等领域的应用开辟了新的方向。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Optical Materials 工程技术-材料科学：综合

CiteScore

6.60

自引率

12.80%

发文量

1265

审稿时长

38 days

期刊介绍： Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review. The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials. OPTICAL MATERIALS focuses on: • Optical Properties of Material Systems; • The Materials Aspects of Optical Phenomena; • The Materials Aspects of Devices and Applications. Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.